Logic circuit probe with screw thread adjustment and interchangeable circuitry to match circuit being monitored

Claim 2

A probe for electrical testing comprising a conductive member, said conductive member further comprising a curved contact portion designed to at least partially encircle a portion of the circuit to be monitored, a housing for at least partially encompassing said conductive member, said housing including a projecting portion and a screw-type advancing mechanism positioned substantially internal to said housing, said screwtype advancing mechanism being designed to advance and retract said conductive member within said projecting portion of said housing to enable the curved contact portion of said conductive member to be advanced into at least partially encircling relationship with the portion of the circuit to be monitored and retracted to clamp the latter against the projecting portion of said housing.

Claim 3

A probe for electrical testing comprising a housing, a contact element including an end portion for engaging a circuIt to be tested, the engaging portion of said contact element being designed to at least partially encircle the engaging portion of the circuit to be tested, means for mounting said contact element in a projecting relationship with respect to said housing and within a cylindrical portion thereof, means for reciprocatively moving said contact element within said cylindrical portion of said housing, said last named means further comprising a screw-type adjusting mechanism positioned substantially internal to said housing and attached to said contact element whereby said contact element may be initially advanced sufficiently to enable the engaging portion thereof to partially encircle the engaging portion of the circuit to be tested whereafter withdrawal of said elongated conductor results in a positive clamping of the circuit to be tested to the terminal portion of said cylindrical portion of said housing.

Claim 4

A probe for electrical testing comprising a housing, a contact element including an end portion for engaging a circuIt to be tested, the engaging portion of said contact element being designed to at least partially encircle the engaging portion of the circuit to be tested, means for mounting said contact element in a projecting relationship with respect to said housing and within a cylindrical portion thereof, means for reciprocatively moving said contact element within said cylindrical portion of said housing, said last named means further comprising a screw-type adjusting mechanism positioned substantially internal to said housing and attached to said contact element whereby said contact element may be initially advanced sufficiently to enable the engaging portion thereof to partially encircle the engaging portion of the circuit to be tested whereafter withdrawal of said elongated conductor results in a positive clamping of the circuit to be tested to the terminal portion of said cylindrical portion of said housing.

Claim 5

A probe for the electrical testing of microelectronic circuits of the digital variety, said probe being of the type comprising a housing, a contact element for engaging a circuit to be monitored and means for connecting said probe structure to a monitoring apparatus, the improvement comprising an interchangeable logic pack designed to represent one logical unit load to the circuit being tested, means within said housing for receiving said interchangeable logic pack, said last named means including means for interconnecting said contact element and said means for connecting said probe structure to a monitoring apparatus.

Claim 6

A probe for the electrical testing of microelectronic circuits of the digital variety, said probe being of the type comprising a housing, a contact element for engaging a circuit to be monitored and means for connecting said probe structure to a monitoring apparatus, the improvement comprising an interchangeable logic pack designed to represent one logical unit load to the circuit being tested, means within said housing for receiving said interchangeable logic pack, said last named means including means for interconnecting said contact element and said means for connecting said probe structure to a monitoring apparatus.

Claim 7

A probe as defined in claim 1 wherein means are provided within said housing for receiving an interchangeable electronic pack, said interchangeable electronic pack being designed to match the electrical characteristics of a circuit to be monitored.

Claim 8

A probe for electrical testing comprising a housing, an elongated electrically conductive member positioned within said housing and having a contact portion designed to engage a portion of a circuit to be monitored, a screw-type adjusting mechanism positioned substantially internal to said housing and operatively connected to said elongated electrically conductive member for reciprocatively moving the latter relative to said housing to thereby enable the contact portion of said elongated electrically conductive member to be brought into positive relationship with said circuit to be monitored and for clamping the engaged portion of said housing, and an interchangeable logic pack positioned within the probe housing and connected to said electrically conductive member, said logic pack being designed to match the type logic used in the implementation of the circuit being monitored and to present one logical unit load to said circuit.

Claim 9

A probe for electrical testing comprising a housing, an elongated electrically conductive member positioned within said housing and having a contact portion designed to engage a portion of a circuit to be monitored, a screw-type adjusting mechanism positioned substantially internal to said housing and operatively connected to said elongated electrically conductive member for reciprocatively moving the latter relative to said housing to thereby enable the contact portion of said elongated electrically conductive member to be brought into positive relationship with said circuit to be monitored and for clamping the engaged portion of said housing, and an interchangeable logic pack positioned within the probe housing and connected to said electrically conductive member, said logic pack being designed to match the type logic used in the implementation of the circuit being monitored and to present one logical unit load to said circuit.

Claim 10

A probe for electrical testing comprising an elongated conductor including a partially encircling contact portion designed to engage a portion of a circuit to be monitored, said partially encircling contact portion having a radius greater than the thickness of said conductor, a housing having a projecting conductive cylindrical portion, a nonconductive coating covering a substantial portion of the exterior surface of said projecting conductive cylindrical portion of said housing, means including a screw-actuated mechanism position internal to said housing for axially moving said elongated conductor within said housing, at least a portion of said projecting cylindrical portion of said housing being slotted to permit said partially encircling contact portion of said elongated conductor to be at least partially withdrawn into said slot whereby said elongated conductor may be initially advanced sufficiently to enable the contact portion thereof to partially encircle the engaging portion of a circuit to be tested whereafter withdrawal of said elongated conductor results in a positive clamping of the probe to the engaged portion of said circuit to be tested.

Claim 11

A probe for electrical testing comprising an elongated conductor including a partially encircling contact portion designed to engage a portion of a circuit to be monitored, said partially encircling contact portion having a radius greater than the thickness of said conductor, a housing having a projecting conductive cylindrical portion, a nonconductive coating covering a substantial portion of the exterior surface of said projecting conductive cylindrical portion of said housing, means including a screw-actuated mechanism position internal to said housing for axially moving said elongated conductor within said housing, at least a portion of said projecting cylindrical portion of said housing being slotted to permit said partially encircling contact portion of said elongated conductor to be at least partially withdrawn into said slot whereby said elongated conductor may be initially advanced sufficiently to enable the contact portion thereof to partially encircle the engaging portion of a circuit to be tested whereafter withdrawal of said elongated conductor results in a positive clamping of the probe to the engaged portion of said circuit to be tested.

Claim 12

The probe structure of claim 1 wherein at least a portion of said projecting portion of said housing comprises an elEctrically conductive member.

Claim 13

The probe structure of claim 1 wherein the extremity of said projecting portion of said housing is slotted to thereby enable the contact portion of said conductive member to be withdrawn at least partially therein.