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US3631772A Expired / Lapsed US ⏱️ 0.0 years remaining

Method and apparatus for characterizing photoresist

Assignee: AT&T Inc
•
Filing: 1969-07-09
•
Granted: 1972-01-04
•
Expires: 1989-07-09
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Abstract

Abstract The margin for error in exposing photoresist during mask making is reduced by online use of a new test mask. The mask consists of a glass plate coated on one face with a gradient of deposited chromium. On the reverse face, in the direction of the gradient, a linear array of microtest patterns in chromium are deposited. Resolution capability and optimum exposure for a required resolution of circuit pattern and for a given batch of photoresist are determined by coating a sample wafer and exposing through the test mask.

Inventors

  • 👤 Robert K Curran
  • 👤 Robert E Kerwin

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-08 19:48
CPC Classifications
G; G03; G03C; G03C5/00; G03C5/02; G03F; G03F1/00; G03F1/38; G03F1/44; G03F7/00; G03F7/20; G03F7/70; G03F7/70483; G03F7/7055; G03F7/70558

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 19 words
A test mask in accordance with claim 1, wherein said granular matter and said microtest patterns are deposited chromium.
Claim 2
Dependent Claim 28 words
A test pattern in accordance with claim 1, wherein said coating comprises a plurality of contiguous, rectangular zones of chromium deposited in increasing concentrations with each successive zone.
Claim 3
Dependent Claim 39 words
A test pattern in accordance with claim 3, wherein the optical densities of the successive said zones vary from approximately zero for a first edge zone to about three for the opposite edge zone, each optical density being calibrated.
Claim 4
Dependent Claim 25 words
A test pattern in accordance with claim 3, wherein said microtest patterns are aligned linearly across said zones, one such pattern registering with each zone.

References Cited (Backward Citations)

US3236290A Cited
US3381572A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1975-01-03 1975-07-05 1976-01-04 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1979-01-03 1979-07-05 1980-01-04 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1983-01-03 1983-07-05 1984-01-04 $7700.00 Window Closed / Lapsed

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