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US3623217A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of manufacturing a field effect semiconductor device

Assignee: Hitachi Ltd
•
Filing: 1969-11-26
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Granted: 1971-11-30
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Expires: 1989-11-26
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Abstract

Abstract A METHOD OF MANUFACTURING AN MIS TYPE FET, WHEREIN, AFTER SOURCE AND DRAIN REGIONS ARE FORMED IN A SURFACE OF A SEMICONDUCTOR BODY, A PART OF AN INSULATING FILM WHICH HAS BEEN USED AS A SELECTIVE DIFFUSION MASK IS REMOVED TO EXPOSE A CARRIER PATH BETWEEN THE REGIONS AND A CONTINUOUS PART OF THE SOURCE REGION, WHILE THE OTHER PART OF THE INSULATING FILM COVERING THE SEMICONDUCTOR SURFACE, ESPECIALLY, THE SURFACE PORTION OF THE DRAIN REGION ADJACENT TO THE CARRIER PATH IS LEFT, THEN THE EXPOSED SURFACE OF THE BODY IS AGAIN COVERED WITH A FURTHER INSULATING FILM WHICH IS THINNER THAN THAT OF THE REMAINING INSULATING FILM, AND THEN A CONTROL ELECTRODE IS FORMED ON THE FURTHER INSULATING FILM.

Inventors

  • 👤 Hiroto Kawagoe
  • 👤 Masaharu Kubo

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-07 22:21
CPC Classifications
H; H10; H10D; H10D84/00; H10D84/80; H10D84/811; H10D84/813; H10D99/00; H10P; H10P14/00; H10P14/60; H10P14/63; H10P14/6302; H10P14/6304; H10P14/6306; H10P14/6308; H10P14/6309; H10P14/6322; H10P14/6326; H10P14/6328; H10P14/69; H10P14/692; H10P14/6921; H10P14/69215

Claims Analysis

Total Claims: 0
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References Cited (Backward Citations)

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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1974-11-29 1975-05-31 1975-11-30 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1978-11-29 1979-05-31 1979-11-30 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1982-11-29 1983-05-31 1983-11-30 $7700.00 Window Closed / Lapsed

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