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US3620832A Expired / Lapsed US ⏱️ 0.0 years remaining

Electrode system particularly semiconductor electrode system and method of producing the same

Assignee: US Philips Corp
•
Filing: 1967-04-11
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Granted: 1971-11-16
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Expires: 1987-04-11
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Abstract

Abstract An electrode system comprising a semiconductive granular layer substantially one grain in thickness is manufactured by embedding a layer of this semiconductive material in an insulating material, e.g., polyurethane so that the peaks of the grains extend substantially above the insulating material i.e., the spaces between the grains are filled to a level well below the peaks of the grains. An electrode is formed on this layer by depositing an electrically conducting layer. The so-coated layer is thereafter subjected to an abrasive on a carrier comprising grains whose average diameter is smaller than the average diameter of the electrically active grains and whose diameter exceeds the average spacing between the active grains to remove only the electrode layer covering the exposed grain peaks without abrading the grains themselves. The grain size of the abrasive is critical to avoid grains of the abrasive being lodged in the depressions between the grains of the semiconductive material and to avoid removing portions of the semiconductive grains.

Inventors

  • 👤 Ties Siebolt Te Velde

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-01 21:59
CPC Classifications
H; H01; H01B; H01B1/00; H01B1/20; H05; H05B; H05B33/00; H05B33/12; H05B33/26; H05B33/28; H10; H10F; H10F77/00; H10F77/10; H10F77/16; H10F77/162

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 27 words
A method as set forth in claim 1 wherein the abrasive grains have a diameter between two and five times the average spacing between electrically active grains.
Claim 2
Dependent Claim 28 words
A method as set forth in claim 1 wherein the abrasive grains have a diameter between one-fifth and one-tenth of the average diameter of the electrically active grains.
Claim 3
Dependent Claim 23 words
A method as claimed in claim 1 wherein, subsequent to the abrading step, the granular layer is suBjected to ion or electron bombardment.
Claim 4
Dependent Claim 32 words
A method as claimed in claim 1 wherein, subsequent to the abrading step, a second electrically conductive coating is applied onto the exposed grain surfaces and electrode layer portions left in position.
Claim 5
Dependent Claim 21 words
A method as set forth in claim 1 wherein electrode means are provided on the opposite side of the granular layer.
Claim 6
Dependent Claim 21 words
A method as set forth in claim 1 wherein the grains comprise cadmium sulfide, zinc sulfide, cadmium selenide, or zinc selenide.
Claim 7
Dependent Claim 20 words
A method as set forth in claim 7 wherein the metal electrode comprises indium and the filling substance is polyurethane.

References Cited (Backward Citations)

US2201196A Cited
US2915785A Cited
US3031344A Cited
US2904613A Cited
US3108021A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1974-11-15 1975-05-17 1975-11-16 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1978-11-15 1979-05-17 1979-11-16 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1982-11-15 1983-05-17 1983-11-16 $7700.00 Window Closed / Lapsed

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