← Back to Patent Explorer
US3615955A Expired / Lapsed US ⏱️ 0.0 years remaining

Method for polishing a silicon surface

Assignee: International Business Machines Corp
•
Filing: 1969-02-28
•
Granted: 1971-10-26
•
Expires: 1989-02-28
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract A silicon surface is polished by a simultaneous application of mechanical and chemical polishing procedures. The silicon surface to be polished is maintained continuously wetted with an excess quantity of a displacement plating solution containing a mercury cation and a fluoride anion. Mercury is deposited on the surface by the displacement of silicon and a simultaneous and continuous wiping of the surface removes the mercury from the high areas on the silicon surface.

Inventors

  • 👤 Joseph Regh
  • 👤 Gene A Silvey

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-02 16:43
CPC Classifications
H; H10; H10P; H10P90/00; H10P90/12; H10P90/129; B; B24; B24B; B24B37/00; B24B37/04; B24B37/07; B24B37/10; B24B37/102; C; C23; C23F; C23F3/00; C23F3/04; C23F3/06

Claims Analysis

Total Claims: 9
Claim 1
Independent Claim 39 words
The method of claim 1 wherein the said solution is aqueous; the mercury cation is brought into the said solution by use of mercury nitrate; and the fluoride anion is brought into said solution by use of ammonium fluoride.
Claim 2
Dependent Claim 27 words
The method of claim 1 wherein the said silicon impurity is arsenic or antimony and the solution is maintained at a pH between about 5 to 7.
Claim 3
Dependent Claim 18 words
The method of claim 1 wherein the said pressure applied is above about 1 pound per square inch.
Claim 4
Dependent Claim 29 words
The method of claim 1 wherein the said silicon surface is planar and is one face of a silicon wafer and said firm surface is a supported paper layer.
Claim 5
Dependent Claim 30 words
The method of claim 1 wherein the said silicon surface is planar and is one face of a silicon wafer and said firm surface is a supported napped cloth layer.
Claim 6
Independent Claim 199 words
A method for polishing a monocrystalline silicon planar surface to a high-degree of surface perfection suitable for epitaxial deposition wherein the silicon planar surface can have an impurity concentration higher than 1 X 1018 atoms/cc. comprising: maintaining the said silicon surface continuously wetted with an excess quantity of an aqueous displacement plating solution having a PH less than 7 containing a mercury cation and a fluoride anion to cause a displacement plating of mercury onto the said silicon surface; the said fluoride anion is maintained in excess quantities to said mercury cation which is present in quantity sufficient for the desired polishing rate; continuously wiping the said silicon surface with a soft, firm surface using a pressure greater than about 1 pound per square inch while maintaining a relative rotating movement between the said silicon surface and the said soft surface to remove the said mercury from the high-points of said silicon surface; and after the said silicon surface has been adequately polished, replacing said plating solution with a nonplating medium wetting the said silicon surface to prevent further polishing and allow said firm surface to remove the maximum amount of said mercury possible from said polished silicon surface.
Claim 7
Dependent Claim 50 words
The method of claim 7 wherein the said solution is aqueous; the mercury cation is brought into the said solution by use of mercury nitrate; the fluoride anion is brought into said solution by use of ammonium fluoride; and the said solution pH is maintained between about 5 and 7.
Claim 8
Dependent Claim 27 words
The method of claim 7 wherein the said planar silicon surface is one faCe of a silicon wafer and said firm surface is a supported paper layer.
Claim 9
Dependent Claim 28 words
The method of claim 7 wherein the said planar silicon surface is one face of a silicon wafer and said firm surface is a supported napped cloth layer.

References Cited (Backward Citations)

No citation records indexed.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1974-10-25 1975-04-26 1975-10-26 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1978-10-25 1979-04-26 1979-10-26 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1982-10-25 1983-04-26 1983-10-26 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag