Spark-type ion source and downstream deflector for mass spectrometer

Claim 2

A mass spectrometer for analyzing material comprising: a. a spark-type ion source including first and second means to mount a pair of electrodes, at least one of which is a sample electrode, in spaced relationship and means for drawing a spark between the electrodes for producing ions of a material to by analyzed, the ions being established as an ion beam along a path; b. one of the mounting means including means for rotating the sample electrode; c. the first mounting means including means for vibrating its supported electrode relative to the other electrode while maintaining the two in spaced relationship; d. a magnetic analyzer disposed along the ion beam path; e. collector means disposed in the ion beam path for receiving ions to be analyzed; and f. deflection means disposed adjacent the ion beam path for deflecting the ion beam so as to interrupt exposure of the ion beam on said collector means.

Claim 3

The apparatus of claim 1 wherein a deflection signal circuit for producing a pulsed deflection signal is connected to the deflection means.

Claim 4

The mass spectrometer of claim 1 wherein the vibrated electrode is a sample.

Claim 5

The mass spectrometer of claim 1 wherein both electrodes are rotated.

Claim 6

A mass spectrometer for analyzing material comprising: a. a pair of electrodes, at least one of which is a cylindrical sample electrode, said electrodes being generally parallel and in side-by-Side relation; b. a spark-type ion source including means to mount the electrodes in spaced relationship and draw a spark therebetween to produce ions of a material to be analyzed, the source also including means to establish the ions as an ion beam along a path; c. the one of the mounting means supporting the sample electrode including means for rotating the sample electrode to increase the area of the sample from which the spark is drawn by drawing the spark over the annular surface portion of the specimen while restraining the sample electrode to prevent movement along its axis; d. a magnetic analyzer disposed along the ion beam path; and, e. collector means disposed in the ion beam path for receiving ions to be analyzed.

Claim 7

A mass spectrometer for analyzing material comprising: a. a pair of electrodes, at least one of which is a cylindrical sample electrode, said electrodes being generally parallel and in side-by-Side relation; b. a spark-type ion source including means to mount the electrodes in spaced relationship and draw a spark therebetween to produce ions of a material to be analyzed, the source also including means to establish the ions as an ion beam along a path; c. the one of the mounting means supporting the sample electrode including means for rotating the sample electrode to increase the area of the sample from which the spark is drawn by drawing the spark over the annular surface portion of the specimen while restraining the sample electrode to prevent movement along its axis; d. a magnetic analyzer disposed along the ion beam path; and, e. collector means disposed in the ion beam path for receiving ions to be analyzed.

Claim 8

The mass spectrometer of claim 5 wherein each mounting means includes means for rotating its supported electrode.

Claim 9

The mass spectrometer of claim 6, wherein the means for rotating the supported electrodes rotate the electrodes in opposite directions such that the portions of the electrodes from which a spark is drawn move toward an ion chamber exit in the direction of ion beam travel.

Claim 10

A mass spectrometer for analyzing material comprising: a. a pair of electrodes, at least one of which is a cylindrical sample electrode, said electrodes being generally parallel and in side-by-side relation; b. a spark-type ion source including means to mount the electrodes in spaced relationship and draw a spark therebetween to produce ions of a material to be analyzed, the source also including means to establish the ions as an ion beam along a path; c. one of the mounting means including means to vibrate its supported electrode substantially constantly to increase the area of the sample from which the spark is drawn by drawing the spark over the surface of the sample of electrode as a spark is drawn toward and away from the other electrode while maintaining the electrodes in spaced relationship; d. a magnetic analyzer disposed along the ion beam path; and, e. collector means disposed in the ion beam path for receiving ions to be analyzed.

Claim 11

A mass spectrometer for analyzing material comprising: a. a pair of electrodes, at least one of which is a cylindrical sample electrode, said electrodes being generally parallel and in side-by-side relation; b. a spark-type ion source including means to mount the electrodes in spaced relationship and draw a spark therebetween to produce ions of a material to be analyzed, the source also including means to establish the ions as an ion beam along a path; c. one of the mounting means including means to vibrate its supported electrode substantially constantly to increase the area of the sample from which the spark is drawn by drawing the spark over the surface of the sample of electrode as a spark is drawn toward and away from the other electrode while maintaining the electrodes in spaced relationship; d. a magnetic analyzer disposed along the ion beam path; and, e. collector means disposed in the ion beam path for receiving ions to be analyzed.

Claim 12

The mass spectrometer of claim 8 wherein each of the mounting means includes means to vibrate its supported electrode while maintaining the electrodes in spaced relationship.

Claim 15

The method of claim 10 wherein intermittently deflecting the ion beam is accomplished by applying a pulsed deflection signal to deflection plates arranged near the ion beam.

Claim 18

The method of claim 12 wherein both electrodes are vibrated as they are maintained in spaced relationship. 14. The method of analyzing material in a mass spectrometer comprising the steps of: a. producing ions of the material to be analyzed by drawing a spark between electrodes, at least one of which is a sample electrode, said electrodes being generally parallel and in side-by-side relation; and, b. distributing the ion production over an annular surface of the sample electrode thereby increasing the area of the sample from which the spark is drawn by rotating the sample electrode as the spark is being drawn while restraining the sample electrode to prevent movement along its axis.

Claim 19

The method of claim 14, wherein both electrodes are rotated simultaneously.

Claim 20

The method of claim 15, wherein the electrodes are rotated in opposite directions such that portions of the electrodes from which a spark is drawn are moved toward the path of ion travel.

Claim 23

The method of claim 17, wherein intermittently deflecting the ion beam is accomplished by applying a pulsed deflection signal to deflection plates arranged near the ion beam.

Claim 26

In a mass spectrometer having an ion source, a collector, structure establishing a path of travel of an ion beam from said ion source to said collector, and an analyzer along said path of travel for deflecting said beam and focusing portions of said beam onto said collector, the improvement comprising: a. deflection means disposed adjacent said path of travel for deflecting said ion beam; and b. energizing means for energizing said deflection means with signals of predetermined width to interrupt focusing of said beam on said collector cyclically during analysis of a given sample to increase reliability of said analysis.

Claim 27

In a mass spectrometer having an ion source, a collector, structure establishing a path of travel of an ion beam from said ion source to said collector, and an analyzer along said path of travel for deflecting said beam and focusing portions of said beam onto said collector, the improvement comprising: a. deflection means disposed adjacent said path of travel for deflecting said ion beam; and b. energizing means for energizing said deflection means with signals of predetermined width to interrupt focusing of said beam on said collector cyclically during analysis of a given sample to increase reliability of said analysis.

Claim 28

The improvement of claim 20, wherein said width is variable.

Claim 29

The improvement of claim 20, wherein said deflection means comprises a pair of spaced apart conductive plates defining a gap through which said ion beam passes when said deflection means are unenergized

Claim 30

The improvement of claim 22, wherein one of said plates is maintained at a constant potential and the other of said plates is connected to said energizing means.

Claim 31

The improvement of claim 23, wherein said constant potential is ground potential.

Claim 32

The improvement of claim 24, wherein said energizing means provides positive signals to prevent said ion beam from passing through said gap.

Claim 33

The improvement of claim 25, wherein said width is variable.

Claim 36

The method of claim 27, wherein the collection of the beam is interrupted by providing a substantially square wave of variable width to deflect said beam.