US3598490A
Expired / Lapsed
US
⏱️ 0.0 years remaining
High-speed symbolization of semiconductor articles
Assignee: Texas Instruments Inc
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Filing: 1968-10-24
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Granted: 1971-08-10
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Expires: 1988-10-24
Abstract
Abstract Tests are conducted on preselected characteristics of semiconductor components. A layer of film is applied to each semiconductor component, the film adapted to exhibit variations in optical transmissivity upon the application of radiant energy. In response to the test results, an image of the desired symbolization is projected upon the layer of film in order to expose the film. Heat or high intensity light is then applied to the exposed film to develop the film and provide the desired symbolization on the semiconductor component.
Inventors
- 👤 Gerald Anthony Yearsley
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-28 01:28
CPC Classifications
H; H10; H10P; H10P72/00; H10P72/06
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
33 words
The method of claim 1, wherein said film darkens upon exposure to ultraviolet light, said image formed by projecting a beam of ultraviolet light through a mask having apertures defining the desired symbolization.
Claim 2
Dependent Claim
24 words
The method of claim 1 wherein said step of developing comprises: heating said layer of film to a sufficient temperature to develop said film.
Claim 3
Independent Claim
92 words
A system for symbolizing electronic components comprising: a. means for testing preselected electrical characteristics of the electronic components; b. means for determining the applicable symbolization for said electronic components from the results of the testing; c. means for applying to said electronic components a layer of film which exhibits variations in optical transmissivity upon the application of radiant energy; d. means for projecting an image of the applicable symbolization upon said layer of film; and e. means for developing said layer of film to provide the desired symbolization upon said electronic components.
Claim 4
Dependent Claim
20 words
The system of claim 4 wherein said film is of the phototropic type and darkens upon exposure to ultraviolet light.
Claim 5
Dependent Claim
23 words
The system of claim 4 wherein said means for developing comprises: means for heating said film layers to a temperature above ambient temperature.
Claim 6
Dependent Claim
24 words
The system of claim 4 wherein said means for projecting an image comprises: a cathode ray tube for projecting a beam of actinic light.
Claim 7
Dependent Claim
40 words
The system of claim 4 wherein said means for projecting an image includes: means for projecting a beam of ultraviolet light toward said electronic components; and mask means defining the desired symbolization disposed between said beam and said electronic components.
Claim 8
Dependent Claim
33 words
The system of claim 8 and further comprising: a film transport having a plurality of masks defined therein, and means for moving said film in accordance with said characteristics of said electronic components.
Claim 9
Dependent Claim
21 words
The system of claim 9 wherein said film transport comprises: a continuous loop of film rotatable about two spaced apart rollers.
Claim 10
Dependent Claim
18 words
The system of claim 10 and further comprising: shutter means for selectively blocking said beam of ultraviolet light.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1974-08-09 | 1975-02-08 | 1975-08-10 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1978-08-09 | 1979-02-08 | 1979-08-10 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1982-08-09 | 1983-02-08 | 1983-08-10 | $7700.00 | Window Closed / Lapsed |