US3596091A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Induced electron emission spectrometer having a unipotential sample chamber
Assignee: Varian Medical Systems Inc
•
Filing: 1969-05-19
•
Granted: 1971-07-27
•
Expires: 1989-05-19
Abstract
Abstract An induced electron emission spectrometer is disclosed which includes a conductive sample enclosure operable at a potential independent of the potential applied to the spectrometer slit defining electrode of the spectrometer. The sample enclosure includes a wall portion made of a metallic foil to define an Xray window through which the sample is irradiated with X-rays to induce electron emission from the sample.
Inventors
- 👤 John C Helmer
- 👤 Norbert H Weichert
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 17:42
CPC Classifications
H; H01; H01J; H01J49/00; H01J49/44; H01J49/46; H01J49/48; H01J49/484; H01J49/482
Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
142 words
In an induced electron emission spectrometer, means for irradiating a sample material so as to cause charged particles to be emitted therefrom, means forming an electrode having a spectrometer slit therein disposed proximate the sample material so that the emitted particles are caused to pass through said slit, charged particle detection means, energy analyzing means disposed between said spectrometer slit and said detection means for focusing charged particles of selected energies into said detector means, all the improvement comprising, means forming a conductive enclosure substantially enclosing the sample material, said enclosure having an opening for passage of the emitted charged particles therethrough to said spectrometer slit, and means for insulatively supporting said sample enclosure relative to said spectrometer slit defining electrode means, whereby said sample enclosure is operable at a potential independent of the potential of said spectrometer slit defining electrode means.
Claim 2
Dependent Claim
142 words
In an induced electron emission spectrometer, means for irradiating a sample material so as to cause charged particles to be emitted therefrom, means forming an electrode having a spectrometer slit therein disposed proximate the sample material so that the emitted particles are caused to pass through said slit, charged particle detection means, energy analyzing means disposed between said spectrometer slit and said detection means for focusing charged particles of selected energies into said detector means, all the improvement comprising, means forming a conductive enclosure substantially enclosing the sample material, said enclosure having an opening for passage of the emitted charged particles therethrough to said spectrometer slit, and means for insulatively supporting said sample enclosure relative to said spectrometer slit defining electrode means, whereby said sample enclosure is operable at a potential independent of the potential of said spectrometer slit defining electrode means.
Claim 3
Dependent Claim
30 words
The apparatus of claim 1 wherein said opening in said sample enclosure is a second slit, said second slit being disposed immediately adjacent said spectrometer slit in substantial registration therewith.
Claim 4
Dependent Claim
57 words
The apparatus of claim 1 wherein said means for irradiating the sample material includes a source of X-rays, said sample enclosure including a portion made of a metal foil to form an X-ray window disposed between said X-ray source and the sample such that X-rays emanating from said X-ray source pass through said foil to the sample.
Claim 5
Dependent Claim
40 words
The apparatus of claim 1 wherein said sample enclosure is apertured and means forming a conductive probe insertable into said sample enclosure through the apertured portion of said enclosure, said probe serving to introduce the sample into said sample enclosure.
Claim 6
Dependent Claim
31 words
The apparatus of claim 4 wherein said probe is slidably insertable into said sample enclosure, and means forming spring contacts for producing electrical contact between said probe and said sample enclosure.
Claim 7
Dependent Claim
22 words
The apparatus of claim 5 wherein said sample enclosure is cylindrical, and said probe is axially insertable of said cylindrical sample enclosure.
Claim 8
Dependent Claim
31 words
The apparatus of claim 6 wherein said sample material is formed as a relatively thin sleeve of sample material coaxially disposed of and carried upon the exterior surface of said probe.
References Cited (Backward Citations)
No citation records indexed.
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1974-07-26 | 1975-01-25 | 1975-07-27 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1978-07-26 | 1979-01-25 | 1979-07-27 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1982-07-26 | 1983-01-25 | 1983-07-27 | $7700.00 | Window Closed / Lapsed |