US3588507A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Beta backscatter thickness measuring apparatus for apertures in printed circuit boards and the like
Assignee: VEECO INSTRUMENTS ACQUISITION CORP
•
Filing: 1968-04-01
•
Granted: 1971-06-28
•
Expires: 1988-04-01
Abstract
Abstract APPARATUS FOR LOCATING A BETA RAY EMITTING PROBE ASSEMBLY AND AN APERTURE IN A PRINTED CIRCUIT BOARD OR OTHER WORKPIECE AT A MEASURING STATION IN PRECISE RELATIONSHIP TO ONE ANOTHER TO EFFECT BETA BACKSCATTER-TYPE MEASUREMENTS OF THE THICKNESSES OF PLATINGS ON A PREDETERMINED AREA ON THE SIDEWALL OF A SELECTED APERTURE, INCLUDING MEANS FOR GUIDING THE PROBE ASSEMBLY FOR MOVEMENT BETWEEN A RETRACTED POSITION AND AN ADVANCED OPERATIVE MEASURING POSITION TO ASSURE DIRECTED IMPINGEMENT OF A COLLIMATED BEAM OF BETA RADIATION ON SAID PREDETERMINED AREA OF THE WALL OF ANY APERTURE SELECTED FROM A PLURALITY OF SIMILAR APERTURES IN A BOARD.
Inventors
- 👤 Jacques J Weinstock
- 👤 William D Hay
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 15:58
CPC Classifications
G; G01; G01N; G01N23/00; G01N23/20; G01N23/203
Claims Analysis
Total Claims: 0
No claims parsed yet. Click Sync Now above to re-index claims from Google Patents.
References Cited (Backward Citations)
No citation records indexed.
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1974-06-27 | 1974-12-27 | 1975-06-28 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1978-06-27 | 1978-12-27 | 1979-06-28 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1982-06-27 | 1982-12-27 | 1983-06-28 | $7700.00 | Window Closed / Lapsed |