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US3584948A Expired / Lapsed US ⏱️ 0.0 years remaining

Apparatus and method for producing multiple images

Assignee: AT&T Inc
•
Filing: 1968-06-24
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Granted: 1971-06-15
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Expires: 1988-06-24
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Abstract

Abstract Multiple images of a photolithography mask are produced, for simultaneously exposing a plurality of regions of a photoresist coating on a semiconductor substrate, by directing monochromatic light through the mask, collimating the light, and transmitting it through a first diffraction grating with vertical rulings and a second diffraction grating with horizontal rulings. The diffraction gratings each divide the light into a plurality of diffraction orders each containing the image to be recorded; and each of these images is imaged on the photoresist coating.

Inventors

  • 👤 Donald R Herriott

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-26 19:51
CPC Classifications
G; G03; G03F; G03F7/00; G03F7/70; G03F7/70425; G03F7/70466; G02; G02B; G02B27/00; G02B27/42; G02B27/4205; G02B27/4222; G03F7/70216; G03F7/70275; H; H10; H10P; H10P76/00; H10P76/20; H10P76/204; H10P76/2041; H10P76/2042; G02B27/10; G02B27/1086

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 43 words
The apparatus of claim 1 wherein: the first diffraction grating comprises a plurality of rulings extending in a first direction; and the second diffraction grating comprises a plurality of rulings extending in a second direction which is substantially orthogonal to the first direction.
Claim 2
Dependent Claim 101 words
In a process for making semiconductor devices which includes the step of exposing a plurality of regions of a photoresist coating on a semiconductor substrate with the image of a mask containing a pattern, the improvement comprising: projecting substantially monochromatic light through a mask; collimating the light; diffracting the light into a plurality of first diffraction orders each containing an image of the mask; diffracting each of the first diffraction orders into a plurality of second diffraction orders each containing an image of the mask; and imaging each of the second diffraction orders onto the photoresist coating of the semiconductor substrate.
Claim 3
Dependent Claim 105 words
The apparatus of claim 1 wherein: each of the mask pattern images contained on each of the first diffraction orders subtends a first angle; each of said first diffraction orders having a separation of at least a second angle; said first angle being smaller than said second angle, whereby said multiple images do not overlap; each of said mask pattern images contained on said second diffraction orders subtending a third angle; each of said second diffraction orders having a separation of at least a fourth angle; and said third angle being smaller than said fourth angle, whereby said multiple mask pattern images do not overlap.
Claim 4
Dependent Claim 76 words
The apparatus of claim 1 wherein said first diffraction grating contains rulings that extend in a first direction; said second grating containing rulings that extend in a second direction orthogonal to said first direction; said rulings on said first and second gratings are substantially identical parallel grooves on a substantially transparent medium; and said grooves have a curvature such as to diffract light of substantially equal intensity along the paths of a plurality of diffraction orders.

References Cited (Backward Citations)

US3399593A Cited
US3408143A Cited
US3478661A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1974-06-14 1974-12-14 1975-06-15 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1978-06-14 1978-12-14 1979-06-15 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1982-06-14 1982-12-14 1983-06-15 $7700.00 Window Closed / Lapsed

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