US3584741A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Batch sorting apparatus
Assignee: International Business Machines Corp
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Filing: 1969-06-30
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Granted: 1971-06-15
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Expires: 1989-06-30
Abstract
Abstract An array of objects in a predetermined sequence and direction of orientation, such as semiconductor chips, is tested and batch sorted by a sorting fixture having a matrix of locations with individually actuable vacuum pickups, while maintaining a predetermined direction of orientation of the objects. A system for this purpose includes a tester for measuring a characteristic of the objects in the array while maintaining them in a predetermined sequence and direction of orientation. Means for storing a result based on the measurements for each object in the array is connected to the tester. The sorting fixture for batch separation of objects with the desired characteristic on the basis of the stored results from the remainder of the objects is connected to the means for storing to allow selection of the objects on the basis of the stored results. Means engageable by the sorting fixture receives the objects having the desired characteristic. The selection and release of the objects to the means engageable by the sorting fixture are both carried out while maintaining a predetermined direction of orientation in the selected objects, enabling reorientation of the objects during their handling to be eliminated.
Inventors
- 👤 Edward F Schirmer
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 22:35
CPC Classifications
H; H10; H10P; H10P72/00; H10P72/06; H10P72/0611; B; B07; B07C; B07C5/00; B07C5/34; B07C5/344; G; G01; G01R; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/073; G01R1/07307; G01R1/07314; Y; Y10; Y10S; Y10S209/00; Y10S209/936
Claims Analysis
Total Claims: 19
Claim 1
Independent Claim
96 words
An apparatus for selecting objects from an array having a desired characteristic from those having an undesired characteristic, comprising: A. means for holding the array of objects, B. a matrix adapted to be positioned over said means for holding the array of objects, said matrix having a location corresponding to each object in the array, and C. individually actuable means for picking up selected ones of the objects while maintaining a predetermined orientation of the selected objects, one of said individually actuable means for picking up the objects being provided at each location in said matrix.
Claim 2
Independent Claim
96 words
An apparatus for selecting objects from an array having a desired characteristic from those having an undesired characteristic, comprising: A. means for holding the array of objects, B. a matrix adapted to be positioned over said means for holding the array of objects, said matrix having a location corresponding to each object in the array, and C. individually actuable means for picking up selected ones of the objects while maintaining a predetermined orientation of the selected objects, one of said individually actuable means for picking up the objects being provided at each location in said matrix.
Claim 3
Dependent Claim
87 words
In combination: A. an apparatus for selecting objects as in claim 1, B. means for determining a characteristic of the objects in the array, C. means connected to said means for determining a characteristic for storing the determination of the characteristic of the objects in the array, and D. means operatively connecting each of said individually actuable means for picking up the objects and said means for storing the determination of the characteristic of the objects for selective actuation of said means for picking up the objects.
Claim 4
Dependent Claim
12 words
The combination of claim 2 in which the objects are semiconductor chips.
Claim 5
Dependent Claim
12 words
The apparatus of claim 1 in which the objects are semiconductor chips.
Claim 6
Independent Claim
137 words
An apparatus for sorting semiconductor chips comprising: A. a dicing block for separating a semiconductor wafer adhesively mounted thereon into an array containing a plurality of semiconductor chips adhesively mounted thereon, B. a matrix engageable with the dicing block to be precisely positioned over a semiconductor wafer diced into an array of adhesively mounted chips on said dicing block, the matrix having a location corresponding to each diced semiconductor chip, C. means for maintaining each chip at its corresponding location in the matrix and in a predetermined direction of orientation after separation from said dicing block, and D. an individually actuable vacuum means for picking up the chip at each matrix location after separation from said dicing block while maintaining each chip in a predeTermined direction of orientation with respect to other chips selected from the array.
Claim 7
Independent Claim
137 words
An apparatus for sorting semiconductor chips comprising: A. a dicing block for separating a semiconductor wafer adhesively mounted thereon into an array containing a plurality of semiconductor chips adhesively mounted thereon, B. a matrix engageable with the dicing block to be precisely positioned over a semiconductor wafer diced into an array of adhesively mounted chips on said dicing block, the matrix having a location corresponding to each diced semiconductor chip, C. means for maintaining each chip at its corresponding location in the matrix and in a predetermined direction of orientation after separation from said dicing block, and D. an individually actuable vacuum means for picking up the chip at each matrix location after separation from said dicing block while maintaining each chip in a predeTermined direction of orientation with respect to other chips selected from the array.
Claim 8
Dependent Claim
35 words
The apparatus of claim 5 in which the matrix allows the chips adhesively mounted on said dicing block to be contacted with a solvent for the adhesive to separate the chips from said dicing block.
Claim 9
Dependent Claim
71 words
The apparatus of claim 6 in which the chips have a plurality of contacts extending above the chip surface and the means for maintaining each chip at its location in the matrix and in a predetermined direction of orientation is a projection on the vacuum means which extends toward the chip surface within the distance the contacts extend above the chip surface when the matrix is engaged with the dicing block.
Claim 10
Dependent Claim
47 words
the apparatus of claim 6 in which the means for maintaining each chip at its location in the matrix and in a predetermined direction of orientation is a plurality of members extending between each chip at its location in the matrix and projecting beyond the vacuum means.
Claim 11
Dependent Claim
86 words
In combination: A. The apparatus for sorting semiconductor chips of claim 5, B. a tester for measuring a characteristic of the chips in the array, C. means for connecting each chip in the array to said tester, D. means for storing the measurement of the characteristic for each chip in the array and its location in the array, and E. means operatively connecting each of said vacuum means and said means for storing for selective actuation of said vacuum means in accordance with the stored measurements.
Claim 12
Independent Claim
143 words
A system for testing and sorting an array of objects in a predetermined direction of orientation, based on their individual characteristics comprising: A. a tester for measuring a characteristic of the objects in the array while maintaining the objects in a predetermined direction of orientation, B. means for storing a result based on the characteristic measured by the tester for each object in the array and its position in the array, C. a sorting means for simultaneous batch separation of objects in the array having a desired characteristic from those having an undesired characteristic while maintaining the objects having the desired characteristic in a predetermined direction of orientation, and D. means engageable by the sorter for receiving the objects in the array having a desired characteristic from the sorter while maintaining the objects having a desired characteristic in a predetermined direction of orientation.
Claim 13
Independent Claim
143 words
A system for testing and sorting an array of objects in a predetermined direction of orientation, based on their individual characteristics comprising: A. a tester for measuring a characteristic of the objects in the array while maintaining the objects in a predetermined direction of orientation, B. means for storing a result based on the characteristic measured by the tester for each object in the array and its position in the array, C. a sorting means for simultaneous batch separation of objects in the array having a desired characteristic from those having an undesired characteristic while maintaining the objects having the desired characteristic in a predetermined direction of orientation, and D. means engageable by the sorter for receiving the objects in the array having a desired characteristic from the sorter while maintaining the objects having a desired characteristic in a predetermined direction of orientation.
Claim 14
Dependent Claim
12 words
The system of claim 10 in which the objects are semiconductor chips.
Claim 15
Dependent Claim
29 words
The system of claim 10 in which the sorting means comprises a plurality of selectively actuable vacuum means for picking up objects in the array having a desired characteristic.
Claim 16
Dependent Claim
86 words
A process for selecting objects from an array having a desired characteristic from those having an undesired characteristic, comprising: A. inspecting the objects to determine which objects in the array have the desired characteristic, B. recording the result of the inspection for each object in the array and its array location, and C. selecting the objects in the array having the desired characteristic simultaneously as a batch on the basis of the stored inspection results while maintaining a predetermined direction of orientation of the selected objects.
Claim 17
Dependent Claim
86 words
A process for selecting objects from an array having a desired characteristic from those having an undesired characteristic, comprising: A. inspecting the objects to determine which objects in the array have the desired characteristic, B. recording the result of the inspection for each object in the array and its array location, and C. selecting the objects in the array having the desired characteristic simultaneously as a batch on the basis of the stored inspection results while maintaining a predetermined direction of orientation of the selected objects.
Claim 18
Dependent Claim
12 words
The process of claim 13 in which the objects are semiconductor chips.
Claim 19
Dependent Claim
14 words
The process of claim 14 in which the semiconductor chips are integrated circuit chips.
References Cited (Backward Citations)
US3503500A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1974-06-14 | 1974-12-14 | 1975-06-15 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1978-06-14 | 1978-12-14 | 1979-06-15 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1982-06-14 | 1982-12-14 | 1983-06-15 | $7700.00 | Window Closed / Lapsed |