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US3575644A Expired / Lapsed US ⏱️ 0.0 years remaining

Semiconductor device with double positive bevel

Assignee: General Electric Co
•
Filing: 1968-10-31
•
Granted: 1971-04-20
•
Expires: 1988-10-31
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Abstract

Abstract To improve the reverse voltage breakdown characteristics of a semiconductor body having a junction therein formed by zones of dissimilar resistivities the periphery of the body adjacent the junction is beveled. With a positive bevel (lowest cross section zone having the highest resistivity) the reverse voltage breakdown characteristics improve progressively as the angle between the junction and the beveled periphery decreases. With two junction bodies having a higher resistivity N or P central zone between P or N zones, respectively, of lower resistivity a positive bevel may be provided at each junction so that a pulleylike concave periphery results with the minimum cross section of the body appearing in the central zone.

Inventors

  • 👤 Gerald C Huth
  • 👤 Robert L Davies

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-28 19:19
CPC Classifications
H; H10; H10D; H10D62/00; H10D62/10; H10D62/102; H10D62/103; H10D62/104; H10P; H10P95/00; H10W; H10W99/00

Claims Analysis

Total Claims: 1
Claim 1
Independent Claim 25 words
A semiconductor device according to claim 1 in which said periphery forms an approximately 6* positive bevel angle with at least one of said junctions.

References Cited (Backward Citations)

US2600500A Cited
US2954307A Cited
US3007090A Cited
US3179860A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1974-04-19 1974-10-19 1975-04-20 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1978-04-19 1978-10-19 1979-04-20 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1982-04-19 1982-10-19 1983-04-20 $7700.00 Window Closed / Lapsed

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