← Back to Patent Explorer
US3555880A Expired / Lapsed US ⏱️ 0.0 years remaining

Liquid density measuring system

Assignee: Industrial Nucleonics Corp
•
Filing: 1967-04-12
•
Granted: 1971-01-19
•
Expires: 1987-04-12
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract DISCLOSED IS A SYSTEM FOR MEASURING THE DENSITY OF A LIQUID IN RESPONSE TO CHANGES IN THE RESONANT FREQUENCY OF A PIEZOELECTRIC CRYSTAL. FIRST AND SECON PIEZOELECTRIC CRYSTALS ARE POSITIONED IN PROXIMITY TO EACH OTHER AND APPROXIMATELY AT THE SAME DEPTH BELOW THE LIQUID SURFACE. ONE OF THE CRYSTALS IS LOADED BY THE LIQUID BEING MONITORED WHILE THE SECOND CRYSTAL IS POSITIONED IN A BODY OF REFERENCE FLUID THAT IS COUPLED WITH THE LIQUID BEING MONITORED SO THAT THE DIFFERENCE IN RESONANT FREQUENCIES OF THE CRYSTALS IS INDICATIVE ONLY OF THE DENSITY OF THE MONITORED LIQUID. THE DIFFERENCE IN THE RESONANT FREQUENCIES OF THE TWO CRYSTALS IS DERIVED BY DRIVING THE CRYSTALS WITH OSCILLATORS, THE OUTPUTS OF WHICH FEED A MIXER DRIVES A FREQUENCY METER.

Inventors

  • 👤 Arthur C Menius Jr
  • 👤 Harry Thomas Bentley

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-23 21:55
CPC Classifications
G; G01; G01N; G01N9/00; G01N9/002; G01N2009/004

Claims Analysis

Total Claims: 0
No claims parsed yet. Click Sync Now above to re-index claims from Google Patents.

References Cited (Backward Citations)

No citation records indexed.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1974-01-18 1974-07-20 1975-01-19 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1978-01-18 1978-07-20 1979-01-19 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1982-01-18 1982-07-20 1983-01-19 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag