US3545867A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of and apparatus for measuring the density of a plasma or transparent semiconductor
Assignee: Alcatel Lucent SAS
•
Filing: 1968-07-03
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Granted: 1970-12-08
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Expires: 1988-07-03
Abstract
No abstract record available.
Inventors
- 👤 Francois Rostas
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 08:11
CPC Classifications
H; H01; H01S; H01S3/00; H01S3/05; H01S3/08; H05; H05H; H05H1/00; H05H1/0006; H05H1/0087
Claims Analysis
Total Claims: 0
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References Cited (Backward Citations)
US3354404A
Cited
US3277392A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1973-12-07 | 1974-06-08 | 1974-12-08 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1977-12-07 | 1978-06-08 | 1978-12-08 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1981-12-07 | 1982-06-08 | 1982-12-08 | $7700.00 | Window Closed / Lapsed |