US3514599A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Electron probe microanalyzer having a plurality of x-ray spectrometers positioned to minimize x-ray defocussing during specimen scanning
Assignee: Cambridge Instruments Ltd
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Filing: 1968-02-16
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Granted: 1970-05-26
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Expires: 1988-02-16
Abstract
No abstract record available.
Inventors
- 👤 Alistair John Campbell
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 11:21
CPC Classifications
G; G01; G01N; G01N23/00; G01N23/20; G01N23/207; G01N23/2076; G01N23/22; G01N23/225; H; H01; H01J; H01J2237/00; H01J2237/244; H01J2237/2441; H01J2237/24415; H01J2237/24425; H01J2237/25; H01J2237/2505; H01J2237/2555; H01J2237/2561
Claims Analysis
Total Claims: 0
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References Cited (Backward Citations)
DE1058166B
Cited
US3107297A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1973-05-25 | 1973-11-24 | 1974-05-26 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1977-05-25 | 1977-11-24 | 1978-05-26 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1981-05-25 | 1981-11-24 | 1982-05-26 | $7700.00 | Window Closed / Lapsed |