US3473977A
Expired / Lapsed
US
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Semiconductor fabrication technique permitting examination of epitaxially grown layers
Assignee: Westinghouse Electric Corp
•
Filing: 1967-02-02
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Granted: 1969-10-21
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Expires: 1987-02-02
Abstract
No abstract record available.
Inventors
- 👤 Glenn W Skouson
- 👤 Marvin H White
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-25 22:39
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/26; G01R31/2644; H; H10; H10D; H10D84/00; H10D84/01; H10D84/0112; H10D84/02; H10D84/03; H10D84/038; H10P; H10P32/00; H10P32/10; H10P32/15; H10P95/00; Y; Y10; Y10S; Y10S148/00; Y10S148/037; Y10S148/085; Y10S148/098
Claims Analysis
Total Claims: 0
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References Cited (Backward Citations)
US3099579A
Cited
US3189494A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1972-10-20 | 1973-04-21 | 1973-10-21 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1976-10-20 | 1977-04-21 | 1977-10-21 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1980-10-20 | 1981-04-21 | 1981-10-21 | $7700.00 | Window Closed / Lapsed |