US3473124A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of electrically testing semiconductor elements retained under a pressure drawn film
Assignee: GTE Sylvania Inc
•
Filing: 1968-02-19
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Granted: 1969-10-14
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Expires: 1988-02-19
Abstract
No abstract record available.
Inventors
- 👤 George B Mann
- 👤 Richard C Tonner
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 20:48
CPC Classifications
G; G01; G01N; G01N27/00; G01N27/02; G01N27/04; G01N27/041; G01R; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/073; G01R1/07307; G01R1/07314
Claims Analysis
Total Claims: 0
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References Cited (Backward Citations)
US3405361A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1972-10-13 | 1973-04-14 | 1973-10-14 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1976-10-13 | 1977-04-14 | 1977-10-14 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1980-10-13 | 1981-04-14 | 1981-10-14 | $7700.00 | Window Closed / Lapsed |