US3466544A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Integrated circuits having integrated test transformation networks incorporated therewith on common substrate chips
Assignee: Boeing Co
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Filing: 1965-10-18
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Granted: 1969-09-09
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Expires: 1985-10-18
Abstract
No abstract record available.
Inventors
- 👤 Harvey L Balderston
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-24 11:17
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/2851; G01R31/2884
Claims Analysis
Total Claims: 0
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References Cited (Backward Citations)
US2851660A
Cited
US2970260A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1972-09-08 | 1973-03-10 | 1973-09-09 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1976-09-08 | 1977-03-10 | 1977-09-09 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1980-09-08 | 1981-03-10 | 1981-09-09 | $7700.00 | Window Closed / Lapsed |