US3445762A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Frequency response testing
Assignee: Eaton Corp
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Filing: 1963-03-13
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Granted: 1969-05-20
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Expires: 1983-03-13
Abstract
No abstract record available.
Inventors
- 👤 William I L Wu
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 05:32
CPC Classifications
G; G01; G01R; G01R27/00; G01R27/28; G01R27/32
Claims Analysis
Total Claims: 1
Claim 1
Independent Claim
119 words
IN A SYSTEM FOR TESTING THE FREQUENCY RESPONSE CHARACTERISTIC OF A SYSTEM UNDER TEST, MEANS FOR GENERATING A FREQUENCY SCANNING TEST SIGNAL RANGING OVER THE RESPONSE FREQUENCIES OF SAID SYSTEM UNDER TEST, MEANS FOR APPLYING SAID TEST SIGNAL TO SAID SYSTEM UNDER TEST AND DERIVING THEREFROM A RESPONSE SIGNAL OF FREQUENCY EQUAL TO SAID TEST SIGNAL BUT OF AMPLITUDE MODIFIED BY SAID RESPONSE CHARACTERISTIC, AND HETERODYNE MEANS RESPONSIVE TO SAID RESPONSE SIGNAL FOR GENERATING AN INVARIABLE FREQUENCY SIGNAL FOR ALL FREQUENCIES OF SAID FREQUENCY SCANNING TEST SIGNAL, AND HETERODYNE MEANS INCLUDING A PAIR OF FREQUENCY STABILIZED OSCILLATORS, AND INVARIABLE FREQUENCY SIGNAL BEING RESPONSIVE TO SAID OSCILLATORS AND EQUAL IN FREQUENCY TO THE DIFFERENCE OF THE FREQUENCIES OF SAID OSCILLATORS.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1972-05-19 | 1972-11-18 | 1973-05-20 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1976-05-19 | 1976-11-18 | 1977-05-20 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1980-05-19 | 1980-11-18 | 1981-05-20 | $7700.00 | Window Closed / Lapsed |