← Back to Patent Explorer
US3436159A Expired / Lapsed US ⏱️ 0.0 years remaining

Internal reflection element for spectroscopy with film optical cavity to enhance absorption

Assignee: Bausch and Lomb Inc
•
Filing: 1966-02-04
•
Granted: 1969-04-01
•
Expires: 1986-02-04
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

No abstract record available.

Inventors

  • 👤 Nicolas J Harrick
  • 👤 Arthur F Turner

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-25 18:16
CPC Classifications
G; G01; G01N; G01N21/00; G01N21/17; G01N21/55; G01N21/552

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 158 words
AN INTERNAL REFLECTION ELEMENT FOR USE IN INTERNAL REFLECTION SPECTROSCOPY, COMPRISING A SUBSTANTIALLY RADIATION TRANSPARENT BODY HAVING A RELATIVELY HIGH INDEX OF REFRACTION, A FRUSTRATED TOTAL REFLECTION FILM HAVING A RELATIVELY LOW INDEX OF REFRACTION ON A SURFACE PORTION OF SAID BODY, AND AN INTERFERENCE FILM HAVING A RELATIVELY HIGH INDEX OF REFRACTION ON THE FRUSTRATED TOTAL REFLECTION FILM, SAID BODY BEING POSITIONED TO RECEIVE A BEAM OF RADIATION AND IMPINGE SAME THROUGH THE FRUSTRATED TOTAL REFLECTION FILM AND THE INTERFERENCE FILM ON THE OUTER SURFACE OF THE LATTER AT AN ANGLE EXCEEDING THE CRITICAL ANGLE SO AS TO CAUSE SAID BEAM TO BE TOTALLY REFLECTED FROM THAT OUTER SURFACE EXCEPT AS ATTENUATED BY THE PRESENCE OF AN ABSORBING MEDIUM ON SAID OUTER SURFACE SAID FRUSTRATED TOTAL REFLECTION FILM HAVING CHARACTERISTICS, INCLUDING THICKNESS, FOR PRODUCING SUBSTANTIAL AMPLITUDE MATCHING OF BEAM COMPONENTS, AND SAID INTERFERENCE FILM HAVING CHARACTERISTICS, INCLUDING THICKNESS, FOR PRODUCING SUBSTANTIAL PHASE MATCHING OF SAID BEAM COMPONENTS.
Claim 2
Dependent Claim 158 words
AN INTERNAL REFLECTION ELEMENT FOR USE IN INTERNAL REFLECTION SPECTROSCOPY, COMPRISING A SUBSTANTIALLY RADIATION TRANSPARENT BODY HAVING A RELATIVELY HIGH INDEX OF REFRACTION, A FRUSTRATED TOTAL REFLECTION FILM HAVING A RELATIVELY LOW INDEX OF REFRACTION ON A SURFACE PORTION OF SAID BODY, AND AN INTERFERENCE FILM HAVING A RELATIVELY HIGH INDEX OF REFRACTION ON THE FRUSTRATED TOTAL REFLECTION FILM, SAID BODY BEING POSITIONED TO RECEIVE A BEAM OF RADIATION AND IMPINGE SAME THROUGH THE FRUSTRATED TOTAL REFLECTION FILM AND THE INTERFERENCE FILM ON THE OUTER SURFACE OF THE LATTER AT AN ANGLE EXCEEDING THE CRITICAL ANGLE SO AS TO CAUSE SAID BEAM TO BE TOTALLY REFLECTED FROM THAT OUTER SURFACE EXCEPT AS ATTENUATED BY THE PRESENCE OF AN ABSORBING MEDIUM ON SAID OUTER SURFACE SAID FRUSTRATED TOTAL REFLECTION FILM HAVING CHARACTERISTICS, INCLUDING THICKNESS, FOR PRODUCING SUBSTANTIAL AMPLITUDE MATCHING OF BEAM COMPONENTS, AND SAID INTERFERENCE FILM HAVING CHARACTERISTICS, INCLUDING THICKNESS, FOR PRODUCING SUBSTANTIAL PHASE MATCHING OF SAID BEAM COMPONENTS.

References Cited (Backward Citations)

US3240111A Cited
US3308709A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1972-03-31 1972-09-30 1973-04-01 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1976-03-31 1976-09-30 1977-04-01 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1980-03-31 1980-09-30 1981-04-01 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag