US3418573A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Universal electronic test system for automatically making static and dynamic tests on an electronic device
Assignee: Texas Instruments Inc
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Filing: 1965-08-25
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Granted: 1968-12-24
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Expires: 1985-08-25
Abstract
No abstract record available.
Inventors
- 👤 John H Alford
- 👤 Harold A Armand
- 👤 William E Bray
- 👤 Edward E Hamilton
- 👤 Leslie L Jasper
- 👤 Robert L Renker
- 👤 Jr Richard M Ryon
- 👤 Samuel D Moore
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 00:15
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/317; G01R31/3181; G01R31/319; G01R31/3193; G01R31/31917
Claims Analysis
Total Claims: 0
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References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1971-12-24 | 1972-06-24 | 1972-12-24 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1975-12-24 | 1976-06-24 | 1976-12-24 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1979-12-24 | 1980-06-24 | 1980-12-24 | $7700.00 | Window Closed / Lapsed |