US3418465A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Radiation source for reducing specimen contamination in electron microscopes
Assignee: Jenoptik AG
•
Filing: 1965-08-17
•
Granted: 1968-12-24
•
Expires: 1985-08-17
Abstract
No abstract record available.
Inventors
- 👤 Hahn Eberhard
- 👤 Hoch Wolfgang
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-06 10:25
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/02; H01J37/20; H01J2237/00; H01J2237/02; H01J2237/022; H01J2237/20; H01J2237/2001; H01J2237/206; H01J2237/2065
Claims Analysis
Total Claims: 0
No claims parsed yet. Click Sync Now above to re-index claims from Google Patents.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1971-12-24 | 1972-06-24 | 1972-12-24 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1975-12-24 | 1976-06-24 | 1976-12-24 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1979-12-24 | 1980-06-24 | 1980-12-24 | $7700.00 | Window Closed / Lapsed |