US3416359A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method and apparatus for testing hermetically sealed transistor devices
Assignee: Texas Instruments Inc
•
Filing: 1966-07-01
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Granted: 1968-12-17
•
Expires: 1986-07-01
Abstract
No abstract record available.
Inventors
- 👤 Hairrel A Durbin
- 👤 Pledger Thomas Ray
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-28 22:48
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/26; G01R31/2601; G01M; G01M3/00; G01M3/02; G01M3/04; G01M3/20; G01M3/202
Claims Analysis
Total Claims: 0
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References Cited (Backward Citations)
US2486199A
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US2526038A
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US3070992A
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US3342990A
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US3327521A
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1971-12-17 | 1972-06-17 | 1972-12-17 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1975-12-17 | 1976-06-17 | 1976-12-17 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1979-12-17 | 1980-06-17 | 1980-12-17 | $7700.00 | Window Closed / Lapsed |