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US3407315A Expired / Lapsed US ⏱️ 0.0 years remaining

Transistor device

Assignee: US Philips Corp
•
Filing: 1966-03-01
•
Granted: 1968-10-22
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Expires: 1986-03-01
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Abstract

No abstract record available.

Inventors

  • 👤 Greefkes Johannes Anton

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 17:38
CPC Classifications
H; H03; H03L; H03L1/00; H03F; H03F1/00; H03F1/30; H03F1/302; H03K; H03K17/00; H03K17/06; H03K17/14; H03K17/51; H03K17/56; H03K17/60; H03K3/00; H03K3/01; H03K3/011; H03K3/02; H03K3/26; H03K3/28; H03K3/281; H03K3/286; H10; H10D; H10D62/00; H10D62/10; H10D62/13; H10D62/137; H10D64/00; H10D64/20; H10D64/23; H10D64/231; H10D84/00; H10D99/00

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 576 words
A CIRCUIT ARRANGEMENT COMPRISING: A FIRST TRANSISTOR INCLUDING: A FIRST BODY OF SEMICONDUCTOR MATERIAL, SAID BODY HAVING A MAJOR SURFACE; A FIRST ZONE OF ONE CONDUCTIVITY TYPE EXTENDING INTO SAID BODY FROM SAID SURFACE FORMING A COLLECTOR REGION; A SECOND ZONE OF OPPOSITE CONDUCTIVITY TYPE INSET INTO SAID FIRST ZONE SAID SURFACE FORMING A BASE REGION; A FIRST P-N JUNCTION FORMED BETWEEN SAID FIRST AND SECOND ZONES, SAID P-N JUNCTION EXTENDING TO SAID SURFACE AND SURROUNDING SAID SECOND ZONE; A THIRD ZONE OF SAID FIRST CONDUCTIVITY TYPE INSET INTO SAID SECOND ZONE FROM SAID SURFACE FORMING AN EMITTER REGION; A SECOND P-N JUNCTION FORMED BETWEEN SAID SECOND AND THIRD ZONES, SAID SECOND P-N JUNCTION EXTENDING TO SAID SURFACE AND SURROUNDING SAID THIRD ZONE; FIRST COLLECTOR CONTACT MEANS CONTACTING SAID FIRST ZONE AT SAID SURFACE; EMITTER CONTACT MEANS CONTACTING SAID THIRD ZONE AT SAID SURFACE; SAID FIRST COLLECTOR CONTACT MEANS AND SAID EMITTER CONTACT MEANS ESTABLISHING A CURRENT PATH BETWEEN SAID FIRST AND THIRD ZONES THROUGH SAID SECOND ZONE; MEANS FOR APPLYING A FIRST POTENTIAL BETWEEN SAID FIRST COLLECTOR CONTACT MEANS AND SAID EMITTER CONTACT MEANS; BASE CONTACTING MEANS CONTACTING SAID SECOND ZONE AT SAID SURFACE; MEANS FOR APPLYING A SECOND POTENTIAL TO SAID BASE CONTACT MEANS TO CONTROL THE CURRENT FLOW BETWEEN SAID FIRST COLLECTOR CONTACT MEANS AND SAID EMITTER CONTACT MEANS; SECOND COLLECTOR CONTACT MEANS CONTACTING SAID FIRST ZONE AT SAID SURFACE, SAID SECOND COLLECTOR CONTACT MEANS BEING REMOTE BOTH FROM SAID CURRENT PATH AND FROM SAID FIRST COLLECTOR CONTACT MEANS; LOAD MEANS CONNECTED TO SAID SECOND COLLECTOR CONTACT MEANS, SAID LOAD MEANS COMPRISING A SECOND TRANSISTOR; SAID SECOND TRANSISTOR INCLUDING: A BODY OF SEMICONDUCTOR MATERIAL, SAID BODY HAVING A MAJOR SURFACE; A FIRST ZONE OF ONE CONDUCTIVITY TYPE EXTENDING INTO SAID BODY FROM SAID SURFACE FORMING A COLLECTOR REGION; A SECOND ZONE OF OPPOSITE CONDUCTIVITY TYPE INSET INTO SAID FIRST ZONE FROM SAID SURFACE FORMING A BASE REGION; A FIRST P-N JUNCTION EXTENDING TO SAID SURFACE AND SURROUNDING SAID SECOND ZONE; A THIRD ZONE OF SAID FIRST CONDUCTIVITY TYPE INSET INGO SECOND ZONE FROM SAID SURFACE FORMING AN EMITTER REGION; A SECOND P-N JUNCTION FORMED BETWEEN SAID SECOND AND THIRD ZONES, SAID SECOND P-N JUNCTION EXTENDING TO SAID SURFACE AND SURROUNDING SAID THIRD ZONE; FIRST COLLECTOR CONTACT MEANS CONTACTING SAID FIRST ZONE AT SAID SURFACE; EMITTER CONTACT MEANS CONTACTING SAID THIRD ZONE AT SAID SURFACE; SAID FIRST COLLECTOR CONTACT MEANS AND SAID EMITTER CONTACT MEANS ESTABLISHING A CURRENT PATH BETWEEN SAID FIRST AND THIRD ZONES THROUGH SAID SECOND ZONE; MEANS FOR APPLYING A FIRST POTENTIAL BETWEEN SAID FIRST COLLECTOR CONTACT MEANS AND SAID EMITTER CONTACT MEANS; BASE CONTACT MEANS CONTACTING SAID SECOND ZONE AT SAID SURFACE; MEANS FOR APPLYING A SECOND POTENTIAL TO SAID BASE CONTACT MEANS TO CONTROL THE CURRENT FLOW BETWEEN SAID FIRST COLLECTOR CONTACT MEANS AND SAID EMITTER CONTACT MEANS; SECOND COLLECTOR CONTACT MEANS CONTACTING SAID FIRST ZONE AT SAID SURFACE, SAID SECOND COLLECTOR BEING REMOTE BOTH FROM SAID CURRENT PATH AND FROM SAID FIRST COLLECTOR CONTACT MEANS; SAID SECOND COLLECTOR CONTACT MEANS OF SAID FIRST TRANSISTOR DIRECTLY CONNECTED TO SAID BASE CONTACT MEANS OF SAID SECOND TRANSISTOR; A FURTHER LOAD MEANS CONNECTED TO SAID SECOND COLLECTOR MEANS OF SAID SECOND TRANSISTOR; AND EACH OF SAID MEANS FOR APPLYING A FIRST POTENTIAL INCLUDES A FIRST AND SECOND SERIALLY CONNECTED P-N JUNCTION DIODES, EACH OF SAID P-N JUNCTION DIODES POLARIZED IN THE FORWARD DIRECTION BY EACH OF THEIR RESPECTIVE TRANSISTOR CURRENT PATHS.
Claim 2
Dependent Claim 576 words
A CIRCUIT ARRANGEMENT COMPRISING: A FIRST TRANSISTOR INCLUDING: A FIRST BODY OF SEMICONDUCTOR MATERIAL, SAID BODY HAVING A MAJOR SURFACE; A FIRST ZONE OF ONE CONDUCTIVITY TYPE EXTENDING INTO SAID BODY FROM SAID SURFACE FORMING A COLLECTOR REGION; A SECOND ZONE OF OPPOSITE CONDUCTIVITY TYPE INSET INTO SAID FIRST ZONE SAID SURFACE FORMING A BASE REGION; A FIRST P-N JUNCTION FORMED BETWEEN SAID FIRST AND SECOND ZONES, SAID P-N JUNCTION EXTENDING TO SAID SURFACE AND SURROUNDING SAID SECOND ZONE; A THIRD ZONE OF SAID FIRST CONDUCTIVITY TYPE INSET INTO SAID SECOND ZONE FROM SAID SURFACE FORMING AN EMITTER REGION; A SECOND P-N JUNCTION FORMED BETWEEN SAID SECOND AND THIRD ZONES, SAID SECOND P-N JUNCTION EXTENDING TO SAID SURFACE AND SURROUNDING SAID THIRD ZONE; FIRST COLLECTOR CONTACT MEANS CONTACTING SAID FIRST ZONE AT SAID SURFACE; EMITTER CONTACT MEANS CONTACTING SAID THIRD ZONE AT SAID SURFACE; SAID FIRST COLLECTOR CONTACT MEANS AND SAID EMITTER CONTACT MEANS ESTABLISHING A CURRENT PATH BETWEEN SAID FIRST AND THIRD ZONES THROUGH SAID SECOND ZONE; MEANS FOR APPLYING A FIRST POTENTIAL BETWEEN SAID FIRST COLLECTOR CONTACT MEANS AND SAID EMITTER CONTACT MEANS; BASE CONTACTING MEANS CONTACTING SAID SECOND ZONE AT SAID SURFACE; MEANS FOR APPLYING A SECOND POTENTIAL TO SAID BASE CONTACT MEANS TO CONTROL THE CURRENT FLOW BETWEEN SAID FIRST COLLECTOR CONTACT MEANS AND SAID EMITTER CONTACT MEANS; SECOND COLLECTOR CONTACT MEANS CONTACTING SAID FIRST ZONE AT SAID SURFACE, SAID SECOND COLLECTOR CONTACT MEANS BEING REMOTE BOTH FROM SAID CURRENT PATH AND FROM SAID FIRST COLLECTOR CONTACT MEANS; LOAD MEANS CONNECTED TO SAID SECOND COLLECTOR CONTACT MEANS, SAID LOAD MEANS COMPRISING A SECOND TRANSISTOR; SAID SECOND TRANSISTOR INCLUDING: A BODY OF SEMICONDUCTOR MATERIAL, SAID BODY HAVING A MAJOR SURFACE; A FIRST ZONE OF ONE CONDUCTIVITY TYPE EXTENDING INTO SAID BODY FROM SAID SURFACE FORMING A COLLECTOR REGION; A SECOND ZONE OF OPPOSITE CONDUCTIVITY TYPE INSET INTO SAID FIRST ZONE FROM SAID SURFACE FORMING A BASE REGION; A FIRST P-N JUNCTION EXTENDING TO SAID SURFACE AND SURROUNDING SAID SECOND ZONE; A THIRD ZONE OF SAID FIRST CONDUCTIVITY TYPE INSET INGO SECOND ZONE FROM SAID SURFACE FORMING AN EMITTER REGION; A SECOND P-N JUNCTION FORMED BETWEEN SAID SECOND AND THIRD ZONES, SAID SECOND P-N JUNCTION EXTENDING TO SAID SURFACE AND SURROUNDING SAID THIRD ZONE; FIRST COLLECTOR CONTACT MEANS CONTACTING SAID FIRST ZONE AT SAID SURFACE; EMITTER CONTACT MEANS CONTACTING SAID THIRD ZONE AT SAID SURFACE; SAID FIRST COLLECTOR CONTACT MEANS AND SAID EMITTER CONTACT MEANS ESTABLISHING A CURRENT PATH BETWEEN SAID FIRST AND THIRD ZONES THROUGH SAID SECOND ZONE; MEANS FOR APPLYING A FIRST POTENTIAL BETWEEN SAID FIRST COLLECTOR CONTACT MEANS AND SAID EMITTER CONTACT MEANS; BASE CONTACT MEANS CONTACTING SAID SECOND ZONE AT SAID SURFACE; MEANS FOR APPLYING A SECOND POTENTIAL TO SAID BASE CONTACT MEANS TO CONTROL THE CURRENT FLOW BETWEEN SAID FIRST COLLECTOR CONTACT MEANS AND SAID EMITTER CONTACT MEANS; SECOND COLLECTOR CONTACT MEANS CONTACTING SAID FIRST ZONE AT SAID SURFACE, SAID SECOND COLLECTOR BEING REMOTE BOTH FROM SAID CURRENT PATH AND FROM SAID FIRST COLLECTOR CONTACT MEANS; SAID SECOND COLLECTOR CONTACT MEANS OF SAID FIRST TRANSISTOR DIRECTLY CONNECTED TO SAID BASE CONTACT MEANS OF SAID SECOND TRANSISTOR; A FURTHER LOAD MEANS CONNECTED TO SAID SECOND COLLECTOR MEANS OF SAID SECOND TRANSISTOR; AND EACH OF SAID MEANS FOR APPLYING A FIRST POTENTIAL INCLUDES A FIRST AND SECOND SERIALLY CONNECTED P-N JUNCTION DIODES, EACH OF SAID P-N JUNCTION DIODES POLARIZED IN THE FORWARD DIRECTION BY EACH OF THEIR RESPECTIVE TRANSISTOR CURRENT PATHS.

References Cited (Backward Citations)

US3284677A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1971-10-22 1972-04-22 1972-10-22 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1975-10-22 1976-04-22 1976-10-22 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1979-10-22 1980-04-22 1980-10-22 $7700.00 Window Closed / Lapsed

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