Measuring device having analyzer for comparing pulses from scale and from cathode ray tube coupled to interferometer output

Claim 1

AN APPARATUS FOR MEASURING LENGTHS COMPRISING AN INTERFEROMETER HAVING A BEAM-DIVIDING MEANS FOR DIVIDING THE BEAM FROM A LIGHT SOURCE INTO A MEASURING BEAM AND A COMPARISON BEAM, A FIRST REFLECTOR DISPLACEABLE ALONG THE AXIAL RAY OF SAID MEASURING BEAM, A SECOND REFLECTOR STATIONARY IN SAID COMPARISON BEAM, A FIRST OPTICAL MEANS FOR DIVIDING INTO TWO PARTIAL BEAMS THE MEASURING BEAM AFTER REFLECTION ON SAID FIRST REFLECTOR AND FOR DIVIDING INTO TWO PARTIAL BEAMS THE COMPARISON BEAM AFTER REFLECTION ON SAID SECOND REFLECTOR, EACH PARTIAL BEAM OF THE MEASURING BEAM BEING COMBINED AND INTERFERED WITH ONE OF THE PARTIAL BEAMS OF THE COMPARISON BEAM, A SECOND OPTICAL MEANS IMPARTING TO THE ONE OF THE COMBINED BEAMS A PHASE-DISPLACEMENT RELATIVE TO THE OTHER, TWO OBJECTIVES RESPECTIVELY DISPOSED IN THE TWO COMBINED BEAMS AND PRODUCING TWO INTERFERENCE IMAGES, A DIAPHRAGM APERTURE IN THE IMAGE PLANE OF EACH OF SAID OBJECTIVES, AND A PHOTOELECTRIC RECEIVER IN THE REAR OF EACH DIAPHRAGM APERTURE, SAID PHOTOELECTRIC RECEIVER TRANSFORMING INTO ELECTRIC PULSES THE LIGHT PULSES OF THE TRAVELING INTERFERENCE IMAGE WHICH TRAVERSE SAID DIAPHRAGM APERTURE WHEN SAID FIRST REFLECTOR IS BEING DISPLACED, AND FURTHER COMPRISING A PHOTOELECTRIC MICROSCOPE FAST WITH SAID FIRST REFLECTOR, A STATIONARY DIVIDED SCALE BELOW SAID MICROSCOPE AND PARALLEL TO SAID AXIAL RAY, SAID SCALE PRODUCING ELECTRIC PULSES IN SAID MICROSCOPE WHEN SAID FIRST REFLECTOR IS BEING DISPLACED, A FIRST AMPLIFIER ELECTRICALLY CONNECTED TO SAID MICROSCOPE, AN ANALYZER ELECTRICALLY CONNECTED TO SAID FIRST AMPLIFIER, MEANS PRODUCING AN ELECTRON RAY, TWO PAIRS OF DEVIATING PLATES FOR SAID ELECTRON RAY LYING CROSS-WISE ON ONE ANOTHER AT THE ANGLE OF SAID PHASE DISPLACEMENT, SAID PAIRS OF DEVIATING PLATES BEING ELECTRICALLY CONNECTED TO ONE OF SAID PHOTOELECTRIC RECEIVERS RESPECTIVELY AND BEING ELECTRICALLY EXCITED BY THE PULSES PRODUCED IN SAID PHOTOELECTRIC RECEIVERS AND CAUSING SAID ELECTRON RAY TO ROTATE, A STATIONARY SLOTTED DISC OF ELECTRICALLY CONDUCTIVE MATERIAL FOR RECEIVING SAID ELECTRON RAY, AND A SECOND AMPLIFIER ELECTRICALLY CONNECTED TO SAID SLOTTED DISC AND TO SAID ANALYZER, SAID ANALYZER ANALYZING THE ELECTRIC PULSES EMANATING FROM SAID MICROSCOPE AND FROM SAID SLOTTED DISC.

Claim 2

AN APPARATUS FOR MEASURING LENGTHS COMPRISING AN INTERFEROMETER HAVING A BEAM-DIVIDING MEANS FOR DIVIDING THE BEAM FROM A LIGHT SOURCE INTO A MEASURING BEAM AND A COMPARISON BEAM, A FIRST REFLECTOR DISPLACEABLE ALONG THE AXIAL RAY OF SAID MEASURING BEAM, A SECOND REFLECTOR STATIONARY IN SAID COMPARISON BEAM, A FIRST OPTICAL MEANS FOR DIVIDING INTO TWO PARTIAL BEAMS THE MEASURING BEAM AFTER REFLECTION ON SAID FIRST REFLECTOR AND FOR DIVIDING INTO TWO PARTIAL BEAMS THE COMPARISON BEAM AFTER REFLECTION ON SAID SECOND REFLECTOR, EACH PARTIAL BEAM OF THE MEASURING BEAM BEING COMBINED AND INTERFERED WITH ONE OF THE PARTIAL BEAMS OF THE COMPARISON BEAM, A SECOND OPTICAL MEANS IMPARTING TO THE ONE OF THE COMBINED BEAMS A PHASE-DISPLACEMENT RELATIVE TO THE OTHER, TWO OBJECTIVES RESPECTIVELY DISPOSED IN THE TWO COMBINED BEAMS AND PRODUCING TWO INTERFERENCE IMAGES, A DIAPHRAGM APERTURE IN THE IMAGE PLANE OF EACH OF SAID OBJECTIVES, AND A PHOTOELECTRIC RECEIVER IN THE REAR OF EACH DIAPHRAGM APERTURE, SAID PHOTOELECTRIC RECEIVER TRANSFORMING INTO ELECTRIC PULSES THE LIGHT PULSES OF THE TRAVELING INTERFERENCE IMAGE WHICH TRAVERSE SAID DIAPHRAGM APERTURE WHEN SAID FIRST REFLECTOR IS BEING DISPLACED, AND FURTHER COMPRISING A PHOTOELECTRIC MICROSCOPE FAST WITH SAID FIRST REFLECTOR, A STATIONARY DIVIDED SCALE BELOW SAID MICROSCOPE AND PARALLEL TO SAID AXIAL RAY, SAID SCALE PRODUCING ELECTRIC PULSES IN SAID MICROSCOPE WHEN SAID FIRST REFLECTOR IS BEING DISPLACED, A FIRST AMPLIFIER ELECTRICALLY CONNECTED TO SAID MICROSCOPE, AN ANALYZER ELECTRICALLY CONNECTED TO SAID FIRST AMPLIFIER, MEANS PRODUCING AN ELECTRON RAY, TWO PAIRS OF DEVIATING PLATES FOR SAID ELECTRON RAY LYING CROSS-WISE ON ONE ANOTHER AT THE ANGLE OF SAID PHASE DISPLACEMENT, SAID PAIRS OF DEVIATING PLATES BEING ELECTRICALLY CONNECTED TO ONE OF SAID PHOTOELECTRIC RECEIVERS RESPECTIVELY AND BEING ELECTRICALLY EXCITED BY THE PULSES PRODUCED IN SAID PHOTOELECTRIC RECEIVERS AND CAUSING SAID ELECTRON RAY TO ROTATE, A STATIONARY SLOTTED DISC OF ELECTRICALLY CONDUCTIVE MATERIAL FOR RECEIVING SAID ELECTRON RAY, AND A SECOND AMPLIFIER ELECTRICALLY CONNECTED TO SAID SLOTTED DISC AND TO SAID ANALYZER, SAID ANALYZER ANALYZING THE ELECTRIC PULSES EMANATING FROM SAID MICROSCOPE AND FROM SAID SLOTTED DISC.