US3386332A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Differential refractometry
Assignee: Individual
•
Filing: 1964-07-13
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Granted: 1968-06-04
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Expires: 1984-07-13
Abstract
No abstract record available.
Inventors
- 👤 Emmett S Watson
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-06 02:20
CPC Classifications
G; G01; G01N; G01N21/00; G01N21/17; G01N21/41; G01N21/4133
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
153 words
A DIFFERENTIAL REFRACTOMETER WHICH COMPRISES: A SOURCE OF ELECTROMAGNETIC RADIATION; A BASE ELEMENT OF A RADIATION TRANSPARENT MATERIAL; MEANS FOR RETAINING BOTH A SAMPLE AND A REFERENCE MATERIAL AGAINST THE SURFACE OF SAID BASE ELEMENT TO FORM RESPECTIVE FIRST AND SECOND INTERFACES THEREWITH; MEANS FOR DIRECTING RADIATION FROM SAID SOURCE ALONG A SINGLE OPTICAL AXIS ONTO EACH OF SAID FIRST AND SECOND INTERFACES AT AN ANGLE THERETO; MEANS FOR ADJUSTING THE ANGLE OF INCIDENCE OF SAID RADIATION ON SAID INTERFACES TO AN ANGLE SLIGHTLY LESS THAN THE CRITICAL ANGLE OR THE ANGLE CORRESPONDING THERETO; DETECTION MEANS RESPONSIVE TO FIRST AND SECOND RADIATION INTENSITIES TO PRODUCE FIRST AND SECOND ELECTRICAL SIGNALS PROPORTIONAL THERETO; MEANS FOR DIRECTING RADIATION LEAVING EACH OF SAID FIRST AND SECOND INTERFACES AGAINST SAID DETECTION MEANS; AND READOUT MEANS FOR CONVERTING SAID ELECTRICAL SIGNALS TO A VISUALLY OBSERVABLE INDICATION OF THE DIFFERENCE IN REFRACTIVE INDEX OF THE SAMPLE AND REFERENCE MATERIALS.
Claim 2
Dependent Claim
153 words
A DIFFERENTIAL REFRACTOMETER WHICH COMPRISES: A SOURCE OF ELECTROMAGNETIC RADIATION; A BASE ELEMENT OF A RADIATION TRANSPARENT MATERIAL; MEANS FOR RETAINING BOTH A SAMPLE AND A REFERENCE MATERIAL AGAINST THE SURFACE OF SAID BASE ELEMENT TO FORM RESPECTIVE FIRST AND SECOND INTERFACES THEREWITH; MEANS FOR DIRECTING RADIATION FROM SAID SOURCE ALONG A SINGLE OPTICAL AXIS ONTO EACH OF SAID FIRST AND SECOND INTERFACES AT AN ANGLE THERETO; MEANS FOR ADJUSTING THE ANGLE OF INCIDENCE OF SAID RADIATION ON SAID INTERFACES TO AN ANGLE SLIGHTLY LESS THAN THE CRITICAL ANGLE OR THE ANGLE CORRESPONDING THERETO; DETECTION MEANS RESPONSIVE TO FIRST AND SECOND RADIATION INTENSITIES TO PRODUCE FIRST AND SECOND ELECTRICAL SIGNALS PROPORTIONAL THERETO; MEANS FOR DIRECTING RADIATION LEAVING EACH OF SAID FIRST AND SECOND INTERFACES AGAINST SAID DETECTION MEANS; AND READOUT MEANS FOR CONVERTING SAID ELECTRICAL SIGNALS TO A VISUALLY OBSERVABLE INDICATION OF THE DIFFERENCE IN REFRACTIVE INDEX OF THE SAMPLE AND REFERENCE MATERIALS.
References Cited (Backward Citations)
US2442910A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1971-06-04 | 1971-12-04 | 1972-06-04 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1975-06-04 | 1975-12-04 | 1976-06-04 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1979-06-04 | 1979-12-04 | 1980-06-04 | $7700.00 | Window Closed / Lapsed |