US3384556A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of electrolytically detecting imperfections in oxide passivation layers
Assignee: Unisys Corp
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Filing: 1964-11-23
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Granted: 1968-05-21
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Expires: 1984-11-23
Abstract
No abstract record available.
Inventors
- 👤 Robert F Rohde
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 18:33
CPC Classifications
G; G01; G01N; G01N27/00; G01N27/26; G01N27/416; G01N27/42; H; H10; H10W; H10W74/00; H10W74/40; H10W74/43
Claims Analysis
Total Claims: 1
Claim 1
Independent Claim
52 words
A METHOD OF DETECTING AND LOCATING PINHOLES OCCURRING BENEATH OHMIC CIRCUIT PATTERNS DEPSITED OVER SURFACE OXIDE PASSIVATION LAYERS GROWN ON A PLANAR SEMICONDUCTOR DEVICE, SAID PINHOLES EXTENDING THROUGH THE OXIDE PASSIVATION LAYERS TO A SUBSTRATE SURFACE AND TO ACTIVE AND PASSIVE ELEMENTS GROWN INTO THE DEVICE, SAID METHOD COMPRISING THE STEPS OF:
References Cited (Backward Citations)
US3188251A
Cited
US3282805A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1971-05-21 | 1971-11-20 | 1972-05-21 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1975-05-21 | 1975-11-20 | 1976-05-21 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1979-05-21 | 1979-11-20 | 1980-05-21 | $7700.00 | Window Closed / Lapsed |