US3374346A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Spectroscopic electron microscope wherein a specimen is irradiated with x-rays and the electrons emitted are energy analyzed
Assignee: Hitachi Ltd
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Filing: 1965-07-12
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Granted: 1968-03-19
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Expires: 1985-07-12
Abstract
No abstract record available.
Inventors
- 👤 Watanabe Hiroshi
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-25 22:19
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/02; H01J37/04; H01J37/05; H01J37/252
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
160 words
A SPECTROSCOPIC ELECTRON MICROSCOPE COMPRISING MEANS FOR IRRADIATING THE SPECIMEN UNDER EXAMINATION WITH X-RAYS OF A PREDETERMINED WAVELENGTH, AN OBJECTIVE LENS, AND AN AXIAL ARRANGEMENT BETWEEN THE OBJECTIVE LENS AND THE IMAGING PLANE OF THE MICROSCOPE OF COMPONENTS INCLUDING: A FIRST DEFLECTING DEVICE FOR DEFLECTING THE ELECTRON IMAGE OF THE SPECIMEN FORMED BY THE OBJECTIVE LENS, A FIRST APERTURE DIAPHRAGM HAVING A SMALL APERTURE OR SLIT AND DISPOSED IN THE IMAGING PLANE OF THE OBJECTIVE LENS, MEANS FOR ENERGY ANALYSIS OF THE ELECTRONS PASSING IN TIME SEQUENCE THROUGH SAID FIRST APERTURE DIAPHRAGM TO FORM THE RESPECTIVE POINTS OF SAID IMAGE OF THE SPECIMEN, A SECOND APERTURE DIAPHRAGM ADAPTED TO ALLOW PASSAGE OF ONLY THOSE ELECTRONS HAVING ANY DESIRED ENERGY VALUE OF ALL THE ELECTRONS ANALYZED BY SAID MEANS FOR ENERGY ANALYSIS, AND A SECOND DEFLECTING DEVICE FOR DEFLECTING THE RAYS OF MONOENERGETIC ELECTRONS PASSING THROUGH SAID SECOND APERTURE DIAPHRAGM TOWARD THEIR RESPECTIVE POSITIONS IN THE IMAGING PLANE OF THE MICROSCOPE.
Claim 2
Dependent Claim
160 words
A SPECTROSCOPIC ELECTRON MICROSCOPE COMPRISING MEANS FOR IRRADIATING THE SPECIMEN UNDER EXAMINATION WITH X-RAYS OF A PREDETERMINED WAVELENGTH, AN OBJECTIVE LENS, AND AN AXIAL ARRANGEMENT BETWEEN THE OBJECTIVE LENS AND THE IMAGING PLANE OF THE MICROSCOPE OF COMPONENTS INCLUDING: A FIRST DEFLECTING DEVICE FOR DEFLECTING THE ELECTRON IMAGE OF THE SPECIMEN FORMED BY THE OBJECTIVE LENS, A FIRST APERTURE DIAPHRAGM HAVING A SMALL APERTURE OR SLIT AND DISPOSED IN THE IMAGING PLANE OF THE OBJECTIVE LENS, MEANS FOR ENERGY ANALYSIS OF THE ELECTRONS PASSING IN TIME SEQUENCE THROUGH SAID FIRST APERTURE DIAPHRAGM TO FORM THE RESPECTIVE POINTS OF SAID IMAGE OF THE SPECIMEN, A SECOND APERTURE DIAPHRAGM ADAPTED TO ALLOW PASSAGE OF ONLY THOSE ELECTRONS HAVING ANY DESIRED ENERGY VALUE OF ALL THE ELECTRONS ANALYZED BY SAID MEANS FOR ENERGY ANALYSIS, AND A SECOND DEFLECTING DEVICE FOR DEFLECTING THE RAYS OF MONOENERGETIC ELECTRONS PASSING THROUGH SAID SECOND APERTURE DIAPHRAGM TOWARD THEIR RESPECTIVE POSITIONS IN THE IMAGING PLANE OF THE MICROSCOPE.
References Cited (Backward Citations)
No citation records indexed.
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1971-03-19 | 1971-09-18 | 1972-03-19 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1975-03-19 | 1975-09-18 | 1976-03-19 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1979-03-19 | 1979-09-18 | 1980-03-19 | $7700.00 | Window Closed / Lapsed |