Thickness measuring instrument for electro-conductive objects and associated methods

Claim 1

A THICKNESS MEASURING INSTRUMENT FOR MEASURING THE THICKNESS OF AN ELECTRO-CONDUCTIVE OBJECT, SAID INSTRUMENT COMPRISING A PAIR OF CURRENT SUPPLYING CONTACTS ADAPTED FOR BEING PLACED IN CONTACT WITH SAID OBJECT TO FEED CURRENT THROUGH THE SAME, MEANS FOR FEEDING CURRENT THROUGH SAID CURRENT CONTACTS A PAIR OF VOLTAGE MEASURING CONTACTS ADAPTED FOR BEING PLACED IN CONTACT WITH SAID OBJECT TO DETECT A POTENTIAL DIFFERENCE IN SAID OBJECT DUE TO CURRENT FLOW THROUGH THE SAME, A VOLTAGE INDICATING MEANS ADAPTED TO INDICATE SAID POTENTIAL DIFFERENCE, AND A VARIABLE RESISTANCE ATTENUATOR COUPLING THE VOLTAGE CONTACTS AND THE VOLTAGE INDICATING MEANS, SAID ATTENUATOR HAVING A VARIABLE RESISTANCE VALUE ADAPTED TO CORRESPOND TO THE SPECIFIC ANCE OF SAID OBJECT, SAID VOLTAGE INDICATING MEANS HAVING A THICKNESS SCALE CORRELATED TO A SINGULAR VALUE OF SPECIFIC RESISTANCE WHEREBY UPON ADJUSTMENT OF THE RESISTANCE OF THE ATTENUATOR TO THE PARTICULAR VALUE OF SPECIFIC RESISTANCE OF THE OBJECT TO THE THICKNESS VALUES CAN BE DIRECTLY READ ON SAID INDICATING MEANS, SAID RESISTANCE ATTENUATOR BEING PROVIDED WITH AN INDEXING FOR INDICATING VARIED SPECIFIC RESISTANCE VALUES.