US3358232A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Current and voltage regulated testing apparatus for measuring the impedance characteristics of components
Assignee: Texas Instruments Inc
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Filing: 1962-10-05
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Granted: 1967-12-12
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Expires: 1982-10-05
Abstract
No abstract record available.
Inventors
- 👤 Howard C Dillon
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 18:23
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/26; G01R31/2607; G01R31/2632
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
67 words
IN APPARATUS FOR TESTING SEMICONDUCTOR DEVICES: (A) A PAIR OF TERMINALS FOR CONNECTION TO TWO TERMINALS OF A SEMICONDUCTOR DEVICE WHICH IS TO BE TESTED, (B) A REGULATED VOLTAGE SOURCE ADJUSTABLE IN MAGNITUDE, (C) AN ADJUSTABLE CONSTANT CURRENT SOURCE, (D) MEANS CONNECTING THE VOLTAGE SOURCE AND THE CURRENT SOURCE IN SERIES BETWEEN THE PAIR OF TEST TERMINALS WITH THE TWO SOURCES BEING POLED IN THE SAME DIRECTION,
Claim 2
Dependent Claim
67 words
IN APPARATUS FOR TESTING SEMICONDUCTOR DEVICES: (A) A PAIR OF TERMINALS FOR CONNECTION TO TWO TERMINALS OF A SEMICONDUCTOR DEVICE WHICH IS TO BE TESTED, (B) A REGULATED VOLTAGE SOURCE ADJUSTABLE IN MAGNITUDE, (C) AN ADJUSTABLE CONSTANT CURRENT SOURCE, (D) MEANS CONNECTING THE VOLTAGE SOURCE AND THE CURRENT SOURCE IN SERIES BETWEEN THE PAIR OF TEST TERMINALS WITH THE TWO SOURCES BEING POLED IN THE SAME DIRECTION,
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1970-12-11 | 1971-06-12 | 1971-12-12 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1974-12-11 | 1975-06-12 | 1975-12-12 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1978-12-11 | 1979-06-12 | 1979-12-12 | $7700.00 | Window Closed / Lapsed |