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US3354702A Expired / Lapsed US ⏱️ 0.0 years remaining

Interferometric strain analysis

Assignee: AT&T Inc
•
Filing: 1965-05-04
•
Granted: 1967-11-28
•
Expires: 1985-05-04
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Abstract

No abstract record available.

Inventors

  • 👤 Eisner Edward

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-02 05:02
CPC Classifications
G; G01; G01L; G01L1/00; G01L1/24

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 165 words
THE METHOD OF OBTAINING THE SUM OF THE PRINCIPAL STRAINS AT NUMBEROUS POINTS ON A SURFACE OF AN OBJECT WHICH COMPRISES CALIBRATING A SPECIFIC TRANSPARENT MATERIAL FOR CHANGES IN THICKNESS AND REFRACTIVE INDEX WITH STRAIN, COATING THE SAID SURFACE OF THE OBJECT WITH A THIN FILM OF SAID TRANSPARENT MATERIAL, THE THIN FILM HAVING A THICKNESS OF LESS THAN 0.1 MM. AND HAVING REFLECTIVE COATINGS AT LEAST 94 PERCENT REFLECTING ON ITS MAJOR SURFACES, APPLYING IN COMBINATION MULTIPLE-BEAM INTERFEROMETRIC AND SPECTROSCOPIC TECHNIQUES TO OBTAIN A FIRST PATTERN OF FRINGES OF EQUAL CHROMATIC ORDER FOR A FIRST CONDITION OF STRAIN ON THE OBJECT, SUBJECTING THE OBJECT TO THE STRAINS TO BE INVESTIGATED AND REPEATING THE APPLICATION IN COMBINATION OF THE SAID INTERFEROMETRIC AND SPECTROSCOPIC TECHNIQUES TO OBTAIN A SECOND PATTERN OF FRINGES OF EQUAL CHROMATIC ORDER WHEREBY COMPARISON OF SAID FIRST AND SAID SECOND PATTERNS OF FRINGES PROVIDES INFORMATION RELATIVE TO THE SUM OF THE PRINCIPAL STRAINS AT NUMEROUS POINTS ON THE SURFACE OF THE OBJECT.
Claim 2
Independent Claim 165 words
THE METHOD OF OBTAINING THE SUM OF THE PRINCIPAL STRAINS AT NUMBEROUS POINTS ON A SURFACE OF AN OBJECT WHICH COMPRISES CALIBRATING A SPECIFIC TRANSPARENT MATERIAL FOR CHANGES IN THICKNESS AND REFRACTIVE INDEX WITH STRAIN, COATING THE SAID SURFACE OF THE OBJECT WITH A THIN FILM OF SAID TRANSPARENT MATERIAL, THE THIN FILM HAVING A THICKNESS OF LESS THAN 0.1 MM. AND HAVING REFLECTIVE COATINGS AT LEAST 94 PERCENT REFLECTING ON ITS MAJOR SURFACES, APPLYING IN COMBINATION MULTIPLE-BEAM INTERFEROMETRIC AND SPECTROSCOPIC TECHNIQUES TO OBTAIN A FIRST PATTERN OF FRINGES OF EQUAL CHROMATIC ORDER FOR A FIRST CONDITION OF STRAIN ON THE OBJECT, SUBJECTING THE OBJECT TO THE STRAINS TO BE INVESTIGATED AND REPEATING THE APPLICATION IN COMBINATION OF THE SAID INTERFEROMETRIC AND SPECTROSCOPIC TECHNIQUES TO OBTAIN A SECOND PATTERN OF FRINGES OF EQUAL CHROMATIC ORDER WHEREBY COMPARISON OF SAID FIRST AND SAID SECOND PATTERNS OF FRINGES PROVIDES INFORMATION RELATIVE TO THE SUM OF THE PRINCIPAL STRAINS AT NUMEROUS POINTS ON THE SURFACE OF THE OBJECT.

References Cited (Backward Citations)

US2576489A Cited
US3246558A Cited
US3238839A Cited
GB1025468A Cited
US3178934A Cited
FR1400155A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1970-11-27 1971-05-29 1971-11-28 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1974-11-27 1975-05-29 1975-11-28 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1978-11-27 1979-05-29 1979-11-28 $7700.00 Window Closed / Lapsed

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