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US3297855A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of bonding

Assignee: International Business Machines Corp
•
Filing: 1964-06-26
•
Granted: 1967-01-10
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Expires: 1984-06-26
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Abstract

Abstract 1,035,595. Soldering. INTERNATIONAL BUSINESS MACHINES CORPORATION. June 15, 1965 [June 26, 1964], No. 25182/65. Heading B3R. [Also in Division H1] To bond a wire to a terminal (alloyed electrode) of a semi-conductor device, its end is positioned against the terminal with the aid of the pointed tip of a carbon rod and an electrical pulse is passed through the rod and wire to form the bond without adversely affecting the semi-conductor device. The semi-conductor device may have two or four zones of opposite conductivity type and may be made of silicon or of silicon-germanium alloy, but as described is a germanium PNP transistor. The collector region of the transistor is bonded to a header using a lead-gold alloy. The upper surface of the wafer bears a lead-indium emitter pellet surrounded by a lead-antimony base ring. Emitter and base contact posts pass through insulation in the header. The leads on the header are pushed into a hand-held holder which makes electrical contact to the emitter and base posts. Wires are attached to the upper parts of the posts and terminate close to the emitter and base electrodes. A hand-held pointed carbon rod is used to push a wire into contact with its associated electrode and a current pulse passed from a capacitor, one side of which is connected to the carbon rod by a foot-operated switch and the other side of which is connected to the wire through the transistor holder. The wires are of gold-plated copper, silver-plated copper, or solid gold.

Inventors

  • 👤 Ronald W Bowers

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 07:55
CPC Classifications
H; H10; H10W; H10W72/00; H10W72/071; H10W72/075; H10W72/0711; H10W72/50; H10W72/521; H10W72/522; H10W72/551; H10W72/552; H10W72/5522; H10W72/5525; H10W72/555; H10W90/00; H10W90/701; H10W90/751; H10W90/753; H10W90/754

Claims Analysis

Total Claims: 1
Claim 1
Independent Claim 181 words
IN THE FABRICATION OF SEMICONDUCTOR DEVICES, THE METHOD COMPRISING: PROVIDING A SEMICONDUCTOR DEVICE HAVING A SEMICONDUCTOR WAFER, AN ALLOYED PROJECTION EXTENDING FROM THE TOP OF THE WAFER, A HEADER ON WHICH THE WAFER IS MOUNTED AT ONE SIDE, AND A LEAD WIRE EXTENDING HIGHER THAN THE WAFER TO FORM A LEAD POST AND THROUGH A GLASS BEAD IN THE OTHER SIDE OF THE HEADER TO BELOW THE HEADER TO FORM AN EXTERNAL LEAD; BONDING A WHISKER WIRE TO THE LEAD POST SO THAT THE F REE END OF THE WIRE OVERLAYS THE ALLOYED PROJECTION ON THE WAFER; POSITIONING THE FREE END OF THE WHISKER WIRE INTO CONTACT WITH THE ALLOYED PROJECTION BY USING THE POINTED TIP OF A CARBON ROD SO THAT THE POINTED TIP IS ALIGNED WITH THE ALLOYED PROJECTION; AND PASSING A CAPACITIVE DISCHARGE THROUGH THE POINTED TIP OF THE CARBON ROD, THE WHISKER WIRE, THE LEAD POST AND EXTERNAL LEAD TO MELT MOMENTARILY THE ALLOYED PROJECTION AT THE CONTACT WITH THE WHISKER WIRE SO THAT THE WHISKER WIRE IS SLIGHTLY EMBEDDED IN THE ALLOYED PROJECTION UPON ITS SOLIDIFICATION.

References Cited (Backward Citations)

US2537990A Cited
US2784300A Cited
US2916604A Cited
US3197608A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1970-01-09 1970-07-11 1971-01-10 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1974-01-09 1974-07-11 1975-01-10 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1978-01-09 1978-07-11 1979-01-10 $7700.00 Window Closed / Lapsed

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