US3290127A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Barrier diode with metal contact and method of making
Assignee: AT&T Inc
•
Filing: 1964-03-30
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Granted: 1966-12-06
•
Expires: 1984-03-30
Abstract
No abstract record available.
Inventors
- 👤 Kahng Dawon
- 👤 Martin P Lepselter
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 16:39
CPC Classifications
H; H10; H10D; H10D8/00; H10D8/60; C; C23; C23C; C23C26/00; H10D99/00; H10P; H10P95/00; H10W; H10W20/00; H10W20/40; Y; Y10; Y10S; Y10S428/00; Y10S428/922; Y10S428/9265; Y10S428/929; Y10S428/9335; Y10S428/934; Y10S428/938; Y10T; Y10T428/00; Y10T428/12; Y10T428/12493; Y10T428/12528; Y10T428/12535; Y10T428/12583; Y10T428/1259; Y10T428/12611; Y10T428/12771; Y10T428/12778; Y10T428/12806; Y10T428/12812; Y10T428/12861; Y10T428/12889; Y10T428/12896
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
112 words
A SURFACE BARRIER DIODE COMPRISING A WAFER OF SILICON CIMUICONDUCTOR MATERIAL, A THIN LAYER OF RELATIVELY SMALL EXTENT OF A METAL SILICIDE IN SURFACE BARRIER RELATION ON ONE SURFACE OF SAID SILICON WAFER, SAID METAL BEING ONE SELECTED FROM THE GROUP CONSISTIG OF PALLADIUM, NICKEL, COPPER, RHODIUM, PLATINUM, TUNGSTEN AND MOLYBDENUM, A LAYER OF SILICON DIOXIDE ON THE BALANCE OF SAID ONE SURFACE OF SAID WAFER, A FILM OF A SEALING METAL SELECTED FROM THE GROUP CONSISTING OF CHROMIUM, TITANIUM, VANADIUM AND ZIRCONIUM OVERLYING AT LEAST THE PERIPHERAL PORTIONS OF SAID OXIDE COATING ADJOINING SAID CONTACT LAYER, AND A LAYER OF SAID METAL OVERLYING SAID CONTACT AREA AND SAID SEALING METAL AREA.
Claim 2
Dependent Claim
112 words
A SURFACE BARRIER DIODE COMPRISING A WAFER OF SILICON CIMUICONDUCTOR MATERIAL, A THIN LAYER OF RELATIVELY SMALL EXTENT OF A METAL SILICIDE IN SURFACE BARRIER RELATION ON ONE SURFACE OF SAID SILICON WAFER, SAID METAL BEING ONE SELECTED FROM THE GROUP CONSISTIG OF PALLADIUM, NICKEL, COPPER, RHODIUM, PLATINUM, TUNGSTEN AND MOLYBDENUM, A LAYER OF SILICON DIOXIDE ON THE BALANCE OF SAID ONE SURFACE OF SAID WAFER, A FILM OF A SEALING METAL SELECTED FROM THE GROUP CONSISTING OF CHROMIUM, TITANIUM, VANADIUM AND ZIRCONIUM OVERLYING AT LEAST THE PERIPHERAL PORTIONS OF SAID OXIDE COATING ADJOINING SAID CONTACT LAYER, AND A LAYER OF SAID METAL OVERLYING SAID CONTACT AREA AND SAID SEALING METAL AREA.
References Cited (Backward Citations)
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Cited
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Cited
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1969-12-05 | 1970-06-06 | 1970-12-06 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1973-12-05 | 1974-06-06 | 1974-12-06 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1977-12-05 | 1978-06-06 | 1978-12-06 | $7700.00 | Window Closed / Lapsed |