US3271674A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Circuit variance analyzer including scanner controlled parameter variation of the test circuit
Assignee: TDK Micronas GmbH
•
Filing: 1961-04-28
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Granted: 1966-09-06
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Expires: 1981-04-28
Abstract
No abstract record available.
Inventors
- 👤 Kenneth R Horning
- 👤 Massey John
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-22 23:25
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/316; G01R31/3161
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
115 words
A CIRCUIT VARIANCE ANALYZER FOR DETECTING VARIATIONS IN THE OUTPUT OF A CIRCUIT UNDER TEST, COMPRISING A STANDARD CIRCUIT HAVING OUTPUT CHARACTERISTICS CORRESPONDING TO THE DESIRED OUTPUT CHARACTERISTICS OF SAID CIRCUIT UNDER TEST, SCANNING MEANS DRIVEN AT A RELATIVELY LOW RATE FOR PROVIDING PREDICTABLE COMBINATIONS OF SCANNING OUTPUTS, SELECTING MEANS OPERATED RESPONSIVE TO SAID COMBINATIONS OF OUTPUTS OF SAID SCANNING MEANS FOR SELECTING SUCCESSIVE COMBINATIONS OF CONTROL CIRCUITRY, SAID CONTROL CIRCUITRY OPERATED TO VARY THE PARAMETER OF SAID CIRCUIT UNDER TEST, MEANS DRIVEN AT A RELATIVELY HIGH RATE FOR SIMULTANEOUSLY, REPEATEDLY ENERGIZING THE INPUT OF SAID STANDARD CIRCUIT AND SAID CIRCUIT UNDER TEST TO CAUSE SAID CIRCUITS TO PRODUCE OUTPUTS, COMPARATOR MEANS OPERATED RESPONSIVE TO
Claim 2
Dependent Claim
115 words
A CIRCUIT VARIANCE ANALYZER FOR DETECTING VARIATIONS IN THE OUTPUT OF A CIRCUIT UNDER TEST, COMPRISING A STANDARD CIRCUIT HAVING OUTPUT CHARACTERISTICS CORRESPONDING TO THE DESIRED OUTPUT CHARACTERISTICS OF SAID CIRCUIT UNDER TEST, SCANNING MEANS DRIVEN AT A RELATIVELY LOW RATE FOR PROVIDING PREDICTABLE COMBINATIONS OF SCANNING OUTPUTS, SELECTING MEANS OPERATED RESPONSIVE TO SAID COMBINATIONS OF OUTPUTS OF SAID SCANNING MEANS FOR SELECTING SUCCESSIVE COMBINATIONS OF CONTROL CIRCUITRY, SAID CONTROL CIRCUITRY OPERATED TO VARY THE PARAMETER OF SAID CIRCUIT UNDER TEST, MEANS DRIVEN AT A RELATIVELY HIGH RATE FOR SIMULTANEOUSLY, REPEATEDLY ENERGIZING THE INPUT OF SAID STANDARD CIRCUIT AND SAID CIRCUIT UNDER TEST TO CAUSE SAID CIRCUITS TO PRODUCE OUTPUTS, COMPARATOR MEANS OPERATED RESPONSIVE TO
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1969-09-05 | 1970-03-07 | 1970-09-06 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1973-09-05 | 1974-03-07 | 1974-09-06 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1977-09-05 | 1978-03-07 | 1978-09-06 | $7700.00 | Window Closed / Lapsed |