US3271634A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Glass-encased semiconductor
Assignee: Texas Instruments Inc
•
Filing: 1961-10-20
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Granted: 1966-09-06
•
Expires: 1981-10-20
Abstract
No abstract record available.
Inventors
- 👤 William R Heaton
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-28 16:47
CPC Classifications
H; H10; H10W; H10W70/00; H10W70/40; H10W70/481; H10W76/00; H10W76/40; H10W76/42; H10W76/47; Y; Y10; Y10T; Y10T29/00; Y10T29/49; Y10T29/49002; Y10T29/49117; Y10T29/49121
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
187 words
A SEMICONDUCTOR DEVICE COMPRISING A WAFER OF MONOCRYSTALLINE SEMICONDUCTOR MATERIAL HAVING REGIONS OF OPPOSITE CONDUCTIVITY TYPES THEREIN, A HARD GLASS, CUP-LIKE SHELL COMPOSED OF A GLASS HAVING A GIVEN THERMAL EXPANSION COEFFICIENT AND A GIVEN SOFTENING POINT, A FIRST CONDUCTIVE MEMBER EXTENDING THROUGH A NOTCH IN THE VERTICAL WALL OF SAID SHELL INTO THE INTERIOR OF SAID SHELL, SAID WAFER BEING POSITIONED ON SAID FIRST CONDUCTIVE MEMBER WITHIN SAID SHELL TO PROVIDE ELECTRICAL CONTACT TO SAID WAFER IN A REGION OF ONE CONDUCTIVITY TYPE, A SECOND CONDUCTIVE MEMBER EXTENDING THROUGH A SECOND NOTCH IN THE VERTICAL WALL OF SAID SHELL INTO THE INTERIOR OF SAID SHELL, A THIN CONDUCTIVE LEAD CONNECTING A REGION OF SAID WAFER AT THE OPPOSITE CONDUCTIVITY TYPE TO SAID SECOND CONDUCTIVE MEMBER WITHIN THE SHELL, AND A CASING OF SOLDER GLASS FILLING SAID SHELL AND SURROUNDING SAID WAFER AND THE PORTIONS OF SAID CONDUCTIVE MEMBERS WHICH ARE WITHIN THE SHELL, SAID CASING BEING COMPOSED OF A FUSED GLASS POWDER HAVING A SOFTENING POINT MUCH LOWER THAN THAT OF SAID SHELL AND HAVING A THERMAL EXPANSION COEFFICIENT SUBSTANTIALLY EQUAL TO THAT OF SAID SHELL.
Claim 2
Dependent Claim
187 words
A SEMICONDUCTOR DEVICE COMPRISING A WAFER OF MONOCRYSTALLINE SEMICONDUCTOR MATERIAL HAVING REGIONS OF OPPOSITE CONDUCTIVITY TYPES THEREIN, A HARD GLASS, CUP-LIKE SHELL COMPOSED OF A GLASS HAVING A GIVEN THERMAL EXPANSION COEFFICIENT AND A GIVEN SOFTENING POINT, A FIRST CONDUCTIVE MEMBER EXTENDING THROUGH A NOTCH IN THE VERTICAL WALL OF SAID SHELL INTO THE INTERIOR OF SAID SHELL, SAID WAFER BEING POSITIONED ON SAID FIRST CONDUCTIVE MEMBER WITHIN SAID SHELL TO PROVIDE ELECTRICAL CONTACT TO SAID WAFER IN A REGION OF ONE CONDUCTIVITY TYPE, A SECOND CONDUCTIVE MEMBER EXTENDING THROUGH A SECOND NOTCH IN THE VERTICAL WALL OF SAID SHELL INTO THE INTERIOR OF SAID SHELL, A THIN CONDUCTIVE LEAD CONNECTING A REGION OF SAID WAFER AT THE OPPOSITE CONDUCTIVITY TYPE TO SAID SECOND CONDUCTIVE MEMBER WITHIN THE SHELL, AND A CASING OF SOLDER GLASS FILLING SAID SHELL AND SURROUNDING SAID WAFER AND THE PORTIONS OF SAID CONDUCTIVE MEMBERS WHICH ARE WITHIN THE SHELL, SAID CASING BEING COMPOSED OF A FUSED GLASS POWDER HAVING A SOFTENING POINT MUCH LOWER THAN THAT OF SAID SHELL AND HAVING A THERMAL EXPANSION COEFFICIENT SUBSTANTIALLY EQUAL TO THAT OF SAID SHELL.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1969-09-05 | 1970-03-07 | 1970-09-06 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1973-09-05 | 1974-03-07 | 1974-09-06 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1977-09-05 | 1978-03-07 | 1978-09-06 | $7700.00 | Window Closed / Lapsed |