Probe positioning device for use in measuring and checking semiconductor specimens

Claim 1

IN COMBINATION, A SUPPORTING BASE, A FRAME HAVING PORTIONS EXTENDING VERTICALLY TO SAID BASE AND SUPPORTING AT LEAST TWO SADDLES PIVOTALLY MOUNTED ON VERTICALLY EXTENDING PORTIONS OF SAID FRAME, A DIFFERENT PROBE ARM PIVOTALLY MOUNTED ON EACH OF SAID SADDLES, SAID PROBE ARMS BEING ORIENTED TO HAVE MUTUALLY ADJACENT ENDS, MEANS FOR MOUNTING PROBE POINTS ON THE MUTUALLY ADJACNET ENDS OF SAID PROBE ARMS RESPECTIVELY, MANS TO MOVE EACH OF SAID PROBE ARMS INDEPENDENTLY IN MUTUALLY PERPENDICULAR PLANES, AN ADJUSTABLE WORK-PIECE PLATFORM SUPPORTED ON SAID SUPPORTING BASE AND POSITIONED BENEATH SAID PROBE POINTS, ADJUSTABLE YOKE MEANS PIVOTALLY SECURED TO SAID FRAME FOR RAISING AND LOWERING THE PROBE OINT ENDS OF SAID ARMS RELATIVE TO SAID WORK-PIECE PLATFORM, AND BALANCE MEANS INCLUDED IN EACH OF SAID PROBE ARMS FOR VARYING AND INDICATING THE PRESSURE EXERTED BY THE PROBE POINT ENDS THEREOF ON A SPECIMEN.