US3235727A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Electron probe system
Assignee: First Pennsylvania Banking and Trust Co
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Filing: 1961-03-02
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Granted: 1966-02-15
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Expires: 1981-03-02
Abstract
No abstract record available.
Inventors
- 👤 Shapiro Louis
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 05:58
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/252; H01J37/256
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
167 words
AN X-RAY MICROANALYZER COMPRISING MEANS FOR REMOVABLY SUPPORTING DIFFERENT SPECIMENS TO BE ANALYZED, MEANS FOR PRODUCING A HIGH ENERGY ELECTRON BEAM AND FOR DIRECTING SAID BEAM TO IRRADIATE A SPECIMEN AT SAID SUPPORTING MEANS, TO STIMULATE THE EMISSION OF X-RAYS THAT HAVE DIFFERENT CHARACTERISTICS IN ACCORDANCE WITH THE CHARACTERISTICS OF THE IRRADIATED SPECIMENS, MEANS FOR RECEIVING THE X-RAYS EMITTED FROM AN IRRADIATED SPECIMEN FOR DERIVING ELECTRICAL SIGNAL IN ACCORDANCE WITH THE CHARACTERISTICS THEREOF, SCANNING MEANS FOR PRODUCING AN IMAGE IN ACCORDANCE WITH SAID ELECTRICAL SIGNALS, AND MEANS FOR DEFLECTING SAID ELECTRON BEAM IN A PLURALITY OF MODES, ONE OF WHICH IS OVER AN AREA AND FOR OPERATING SAID SCANNING MEANS IN SYNCHRONISM TO PRODUCE A MAGNIFIED IMAGE OF THE CHARACTERISTICS OF SAID SPECIMEN, SAID DEFLECTING MEANS INCLUDING MEANS FOR VARYING THE RANGE OF DEFLECTION OF SAID BEAM TO VARY THE MAGNIFICATION OF SAID IMAGE AND MEANS FOR PERIODICALLY ALTERNATING DURING SUCCESSIVE TIME PERIODS THE DEFLECTION OF SAID BEAM BETWEEN SAID AREA MODE AND ANOTHER OF SAID MODES.
Claim 2
Dependent Claim
167 words
AN X-RAY MICROANALYZER COMPRISING MEANS FOR REMOVABLY SUPPORTING DIFFERENT SPECIMENS TO BE ANALYZED, MEANS FOR PRODUCING A HIGH ENERGY ELECTRON BEAM AND FOR DIRECTING SAID BEAM TO IRRADIATE A SPECIMEN AT SAID SUPPORTING MEANS, TO STIMULATE THE EMISSION OF X-RAYS THAT HAVE DIFFERENT CHARACTERISTICS IN ACCORDANCE WITH THE CHARACTERISTICS OF THE IRRADIATED SPECIMENS, MEANS FOR RECEIVING THE X-RAYS EMITTED FROM AN IRRADIATED SPECIMEN FOR DERIVING ELECTRICAL SIGNAL IN ACCORDANCE WITH THE CHARACTERISTICS THEREOF, SCANNING MEANS FOR PRODUCING AN IMAGE IN ACCORDANCE WITH SAID ELECTRICAL SIGNALS, AND MEANS FOR DEFLECTING SAID ELECTRON BEAM IN A PLURALITY OF MODES, ONE OF WHICH IS OVER AN AREA AND FOR OPERATING SAID SCANNING MEANS IN SYNCHRONISM TO PRODUCE A MAGNIFIED IMAGE OF THE CHARACTERISTICS OF SAID SPECIMEN, SAID DEFLECTING MEANS INCLUDING MEANS FOR VARYING THE RANGE OF DEFLECTION OF SAID BEAM TO VARY THE MAGNIFICATION OF SAID IMAGE AND MEANS FOR PERIODICALLY ALTERNATING DURING SUCCESSIVE TIME PERIODS THE DEFLECTION OF SAID BEAM BETWEEN SAID AREA MODE AND ANOTHER OF SAID MODES.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1969-02-14 | 1969-08-16 | 1970-02-15 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1973-02-14 | 1973-08-16 | 1974-02-15 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1977-02-14 | 1977-08-16 | 1978-02-15 | $7700.00 | Window Closed / Lapsed |