Patent US2239947A successfully refreshed from Google Patents.
US3211999A
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Method and apparatus for measuring semiconductor volume resistivity by transmission loss in a resonant cavity
Assignee: AT&T Inc
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Filing: 1960-04-27
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Granted: 1965-10-12
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Expires: 1980-04-27
Abstract
No abstract record available.
Inventors
- 👤 George L Allerton
- 👤 James R Seifert
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 04:41
CPC Classifications
G; G01; G01N; G01N22/00; G01N27/00; G01N27/02; G01N27/04; G01N27/041; G01R; G01R27/00; G01R27/28; G01R31/00; G01R31/26; G01R31/2648
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
59 words
A METHOD OF DETERMING THE RESISTIVITY OF SEMICONDUCTOR MATERIALS USING A HIGH FREQUENCY TEST SIGNAL WHICH COMPRISES THE STEPS OF APPLYING A HIGH FREQUENCY SIGNAL TO A HIGH Q RESONANT CAVITY HAVING WALLS SUBSTANTIALLY OF A CONDUCTIVE MATERIAL FORMING AN APERTURE THEREIN AT A POINT OF SUBSTANTIALLY UNIFORM AND HIGH CURRENT DENSITY, PLACING A SAMPLE OF SEMICONDUCTOR MATERIAL OVER
Claim 2
Independent Claim
59 words
A METHOD OF DETERMING THE RESISTIVITY OF SEMICONDUCTOR MATERIALS USING A HIGH FREQUENCY TEST SIGNAL WHICH COMPRISES THE STEPS OF APPLYING A HIGH FREQUENCY SIGNAL TO A HIGH Q RESONANT CAVITY HAVING WALLS SUBSTANTIALLY OF A CONDUCTIVE MATERIAL FORMING AN APERTURE THEREIN AT A POINT OF SUBSTANTIALLY UNIFORM AND HIGH CURRENT DENSITY, PLACING A SAMPLE OF SEMICONDUCTOR MATERIAL OVER
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1968-10-11 | 1969-04-12 | 1969-10-12 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1972-10-11 | 1973-04-12 | 1973-10-12 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1976-10-11 | 1977-04-12 | 1977-10-12 | $7700.00 | Window Closed / Lapsed |