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US3198670A Expired / Lapsed US ⏱️ 0.0 years remaining

Multi-tunnel diode

Assignee: Bunker Ramo Corp
•
Filing: 1961-03-09
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Granted: 1965-08-03
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Expires: 1981-03-09
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Abstract

No abstract record available.

Inventors

  • 👤 Nissim Samuel

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-31 09:50
CPC Classifications
H; H03; H03K; H03K3/00; H03K3/02; H03K3/313; H03K3/315; H10; H10D; H10D99/00; H10P; H10P95/00; Y; Y10; Y10S; Y10S438/00; Y10S438/979

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 141 words
A SEMICONDUCTOR DEVICE COMPRISING: A BODY OF SEMICONDUCTOR MATERIAL, FIRST AND SECOND ADJACENT CONDUCTIVITY REGIONS WITHIN SAID BODY, SAID FIRST REGION BEING DOPED TO DEGENERACY BY A FIRST TYPE CONDUCTIVITY DETERMINING IMPURITY, SAID SECOND REGION BEING DOPED TO DEGENERACY BY AN OPPOSITE TYPE CONDUCTIVITY DETERMINING IMPURITY, AN ABRUPT RECTIFYING JUNCTION WHICH EXHIBITS TUNNELING FORMED THEREBETWEEN, ADDITIONALLY INTRODUCED IMPURITIES IN SAID FIRST REGION, EACH OF SAID ADDITIONAL IMPURITIES HAVING A DISCRETE EMPTY ENERGY LEVEL BAND WITHIN THE FORBIDDEN BAND GAP OF SAID FIRST REGION, EACH OF SAID BANDS BEING SPACED ONE FROM THE OTHER IN SAID FORBIDDEN BAND GAP TO FORM DISCRETE EMPTY ENERGY BANDS INTO WHICH ELECTRONS WILL FLOW FROM SAID SECOND REGION THROUGH SAID JUNCTION AT PREDETERMINED FORWARD ELECTRICAL BIASES APPLIED TO SAID DEVICE TO FORM A CORRESPONDING PLURALITY OF NEGATIVE RESISTANCE REGIONS IN THE CURRENT-VOLTAGE CHARACTERISTICS OF SAID DEVICE.
Claim 2
Dependent Claim 141 words
A SEMICONDUCTOR DEVICE COMPRISING: A BODY OF SEMICONDUCTOR MATERIAL, FIRST AND SECOND ADJACENT CONDUCTIVITY REGIONS WITHIN SAID BODY, SAID FIRST REGION BEING DOPED TO DEGENERACY BY A FIRST TYPE CONDUCTIVITY DETERMINING IMPURITY, SAID SECOND REGION BEING DOPED TO DEGENERACY BY AN OPPOSITE TYPE CONDUCTIVITY DETERMINING IMPURITY, AN ABRUPT RECTIFYING JUNCTION WHICH EXHIBITS TUNNELING FORMED THEREBETWEEN, ADDITIONALLY INTRODUCED IMPURITIES IN SAID FIRST REGION, EACH OF SAID ADDITIONAL IMPURITIES HAVING A DISCRETE EMPTY ENERGY LEVEL BAND WITHIN THE FORBIDDEN BAND GAP OF SAID FIRST REGION, EACH OF SAID BANDS BEING SPACED ONE FROM THE OTHER IN SAID FORBIDDEN BAND GAP TO FORM DISCRETE EMPTY ENERGY BANDS INTO WHICH ELECTRONS WILL FLOW FROM SAID SECOND REGION THROUGH SAID JUNCTION AT PREDETERMINED FORWARD ELECTRICAL BIASES APPLIED TO SAID DEVICE TO FORM A CORRESPONDING PLURALITY OF NEGATIVE RESISTANCE REGIONS IN THE CURRENT-VOLTAGE CHARACTERISTICS OF SAID DEVICE.

References Cited (Backward Citations)

US3018423A Cited
US2983854A Cited
US3024140A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1968-08-02 1969-02-01 1969-08-03 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1972-08-02 1973-02-01 1973-08-03 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1976-08-02 1977-02-01 1977-08-03 $7700.00 Window Closed / Lapsed

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