System for quantitatively measuring one property of dielectric material by applying input signals at two different frequencies to a capacitance probe and varying one input signal to maintain a constant ratio of output signals for the two frequencies

Claim 1

APPARATUS FOR QUANTITATIVE DETERMINATION OF AT LEAST ONE PROPERTY OF A DIELECTRIC MATERIAL, SAID APPARATUS COMPRISING A PLURALITY OF SOURCES OF ELECTRICAL SIGNALS AT DIFFERENT RESPECTIVE FREQUENCIES, DETECTING MEANS, CAPACITIVE PROBE MEANS COUPLED TO SAID SOURCES HAVING SPACED ELECTRODES FOR APPLYING ELECTRICAL SIGNALS FROM SAID SOURCES TO AT LEAST A PORTION OF SAID MATERIAL AND ELECTRICALLY COUPLING SAID DETECTING MEANS TO SAID PORTION, SAID DETECTING MEANS INCLUDING MEANS FOR DERIVING SEPARATE SIGNALS EACH RESULTING FROM THE SIGNALS APPLIED TO SAID PORTION FROM A RESPECTIVE SOURCE AS THESE APPLIED SIGNALS ARE INFLUENCED BY THE MASS OF SAID MATERIAL AND THE DIELECTRIC PROPERTIES OF SAID MATERIAL AT THE FREQUENCY OF THAT SOURCE, MEANS FOR COMBINING SAID SEPARATE SIGNALS TO PRODUCE A CONTINUOUS RESULTANT SIGNAL THAT IS A FUNCTION OF THE RATIO OF THE MAGNITUDES OF SAID SEPARATE SIGNALS, AND MEANS RESPONSIVE TO SAID RESULTANT SIGNAL FOR VARYING THE OUTPUT OF ONE OF SAID SOURCES OF ELECTRICAL SIGNALS.