Admittance meter and dielectric control system

Claim 1

IN AN APPARATUS FOR EFFECTING DYNAMIC LEVEL CONTROL OF A FIRST DIELECTRIC MATERIAL FLOWING ALONG A PREDETERMINED PATH, THE COMBINATION COMPRISING A CAPACITIVE TRANSDUCER DISPOSED ALONG SAID PREDETERMINED PATH AND COMPRISING A PLURALITY OF CAPACITOR PLATES THROUGH WHICH SAID DIELECTRIC MATERIAL FLOWS, A FIRST MOVABLE GATE STRUCTURE ADJACENT SAID TRANSDUCER MOUNTED FOR MOVEMENT IN DIRECTIONS TRANSVERSE TO THE FLOW DIRECTION OF SAID DIELECTRIC MATERIAL, ADMITTANCE MEASUREMENT MEANS COUPLED TO SAID TRANSDUCER FOR GIVING AN ELECTRICAL OUTPUT CHARACTERISTIC OF THE DEPTH OF SAID FLOWING DIELECTRIC MATERIAL BETWEEN SAID PLATES, CONTROL MEANS RESPONSIVE TO THE OUTPUT OF SAID ADMITTANCE MEASUREMENT MEANS FOR VARYING THE POSITION OF SAID FIRST GATE STRUCTURE THEREBY TO VARY THE DEPTH OF SAID FLOWING DIELECTRIC MATERIAL BETWEEN SAID PLATES, MEANS SUPPLYING A SECOND DIELECTRIC MATERIAL FLOWING ALONG A FURTHER PATH INTERSECTING SAID PREDETERMINED PATH AT A POSITION DOWNSTREAM OF SAID TRANSDUCER WHEREBY SAID SECOND DIELECTRIC MATERIAL DILUTES SAID FIRST DIELECTRIC MATERIAL AFTER SAID FIRST DIELECTRIC MATERIAL HAS FLOWED THROUGH SAID TRANSDUCER, A SECOND GATE STRUCTURE FOR VARYING THE DEPTH OF SAID SECOND DIELECTRIC MATERIAL AS IT FLOWS ALONG SAID FURTHER PATH TOWARD SAID INTERSECTING POSITION, AND MEANS FOR VARYING THE POSITION OF SAID SECOND GATE STRUCTURE IN INVERSE RELATION TO VARIATIONS IN THE POSITION OF SAID FIRST GATE STRUCTURE.