US3134689A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Thin film structure and method of making same
Assignee: Intellux Inc
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Filing: 1961-03-24
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Granted: 1964-05-26
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Expires: 1981-03-24
Abstract
No abstract record available.
Inventors
- 👤 Pritikin Nathan
- 👤 Feldman Bernard
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-25 06:54
CPC Classifications
C; C03; C03C; C03C17/00; C03C17/34; C03C17/3411; C03C17/3417; Y; Y10; Y10S; Y10S428/00; Y10S428/90; Y10T; Y10T29/00; Y10T29/49; Y10T29/49002; Y10T29/49082; Y10T29/49099; Y10T428/00; Y10T428/24; Y10T428/24355
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
59 words
A FILM-TYPE RESISTANCE ELEMENT FOR A POTENTIOMETER, COMPRISING: A SUBSTRATE OF GLASS HAVING A VOLUME RESISTIVITY OF AT LEAST ABOUT LOG 10 OHM-CENTIMETERS AT 350*C.; A NONCONDUCTING IRIDIZED METAL OXIDE FILM ON SAID SUBSTRATE; AND A CONDUCTING IRIDIZED METAL OXIDE FILM ON SAID NONCONDUCTING IRIDIZED FILM AND HAVING A RETICULATED SURFACE WITH PEAK-TO-PEAK SPACINGS OF LESS THAN A MICRON.
Claim 2
Dependent Claim
59 words
A FILM-TYPE RESISTANCE ELEMENT FOR A POTENTIOMETER, COMPRISING: A SUBSTRATE OF GLASS HAVING A VOLUME RESISTIVITY OF AT LEAST ABOUT LOG 10 OHM-CENTIMETERS AT 350*C.; A NONCONDUCTING IRIDIZED METAL OXIDE FILM ON SAID SUBSTRATE; AND A CONDUCTING IRIDIZED METAL OXIDE FILM ON SAID NONCONDUCTING IRIDIZED FILM AND HAVING A RETICULATED SURFACE WITH PEAK-TO-PEAK SPACINGS OF LESS THAN A MICRON.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1967-05-26 | 1967-11-25 | 1968-05-26 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1971-05-26 | 1971-11-25 | 1972-05-26 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1975-05-26 | 1975-11-25 | 1976-05-26 | $7700.00 | Window Closed / Lapsed |