US3134077A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Electrical probe apparatus for measuring the characteristics of semiconductor material
Assignee: Tektronix Inc
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Filing: 1961-09-18
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Granted: 1964-05-19
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Expires: 1981-09-18
Abstract
No abstract record available.
Inventors
- 👤 Iv Thomas B Hutchins
- 👤 William C Myers
- 👤 Jean F Delord
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-24 10:39
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/26; G01R31/2607; G01R31/2637
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
153 words
APPARATUS FOR MAKING MOVABLE ELECTRICAL CONNECTIONS TO SEMICONDUCTOR MATERIAL WHICH HAVE CHARACTERISTICS OF OHMIC CONNECTIONS, COMPRISING: A FIRST PAIR OF CONTACT PROBES ELECTRICALLY CONNECTED TOGETHER AND SUPPORTED IN SPACED RELATIONSHIP SO THAT THEY ARE SPACED FROM EACH OTHER BY A DISTANCE SUFFICIENT TO FORM TWO SEPARATE NON-OHMIC CONTACTS WITH SAID SEMICONDUCTOR MATERIAL, A SECOND PAIR OF CONTACT PROBES SIMILAR TO SAID FIRST PAIR OF PROBES CONNECTED TO SAID FIRST PAIR OF PROBES AND SEPARATED THEREFROM BY A DISTANCE SUBSTANTIALLY GREATER THAN SAID SPACING DISTANCE, MEANS TO PRODUCE A FIRST ELECTRICAL CURRENT BETWEEN EACH OF SAID FIRST PAIR OF PROBES AND A SECOND ELECTRICAL CURRENT BETWEEN EACH OF SAID SECOND PAIR OF PROBES WHEN SAID PROBES ARE PLACED IN CONTACT WITH SAID SEMICONDUCTOR MATERIAL IN ORDER TO FORM A SINGLE OHMIC CONNECTION WITH EACH OF SAID PAIRS OF PROBES, AND ELECTRICAL MEASURING MEANS CONNECTED BETWEEN SAID FIRST PAIR AND SAID SECOND PAIR OF PROBES.
Claim 2
Dependent Claim
153 words
APPARATUS FOR MAKING MOVABLE ELECTRICAL CONNECTIONS TO SEMICONDUCTOR MATERIAL WHICH HAVE CHARACTERISTICS OF OHMIC CONNECTIONS, COMPRISING: A FIRST PAIR OF CONTACT PROBES ELECTRICALLY CONNECTED TOGETHER AND SUPPORTED IN SPACED RELATIONSHIP SO THAT THEY ARE SPACED FROM EACH OTHER BY A DISTANCE SUFFICIENT TO FORM TWO SEPARATE NON-OHMIC CONTACTS WITH SAID SEMICONDUCTOR MATERIAL, A SECOND PAIR OF CONTACT PROBES SIMILAR TO SAID FIRST PAIR OF PROBES CONNECTED TO SAID FIRST PAIR OF PROBES AND SEPARATED THEREFROM BY A DISTANCE SUBSTANTIALLY GREATER THAN SAID SPACING DISTANCE, MEANS TO PRODUCE A FIRST ELECTRICAL CURRENT BETWEEN EACH OF SAID FIRST PAIR OF PROBES AND A SECOND ELECTRICAL CURRENT BETWEEN EACH OF SAID SECOND PAIR OF PROBES WHEN SAID PROBES ARE PLACED IN CONTACT WITH SAID SEMICONDUCTOR MATERIAL IN ORDER TO FORM A SINGLE OHMIC CONNECTION WITH EACH OF SAID PAIRS OF PROBES, AND ELECTRICAL MEASURING MEANS CONNECTED BETWEEN SAID FIRST PAIR AND SAID SECOND PAIR OF PROBES.
References Cited (Backward Citations)
No citation records indexed.
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1967-05-19 | 1967-11-18 | 1968-05-19 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1971-05-19 | 1971-11-18 | 1972-05-19 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1975-05-19 | 1975-11-18 | 1976-05-19 | $7700.00 | Window Closed / Lapsed |