Controlled atmosphere X-ray diffraction spectrometer

Claim 1

IN A GONIOMETER FOR AN X-RAY DIFFRACTION SPECTROMETER, INCLUDING A SOURCE OF X-RAYS INCIDENT ON A SAMPLE TO PRODUCE SECONDARY X-RAYS, A ROTATABLE ANALYZING CRYSTAL DIFFRACTING SAID SECONDARY X-RAYS, AND AN X-RAY DETECTOR COAXIALLY ROTATABLE AROUND SAID CRYSTAL, THE IMPROVEMENT WHEREBY THE VOLUME AND PRESSURE OF THE PATH THROUGH WHICH SAID SECONDARY X-RAYS TRAVEL IS MAINTAINED CONSTANT COMPRISING: A CONSTANT VOLUME, ESSENTIALLY GAS-TIGHT, ENCLOSURE COMPRISING A RIGID CHAMBER SURROUNDING THE ANALYZING CRYSTAL, A CYLINDRICAL ARCULATELY-SLOTTED SURFACE ON SAID CHAMBER COAXIAL WITH SAID ANALYZING CRYSTAL; A FIXED PORT MEMBER CARRIED BY SAID CHAMBER; A FIRST TUNNEL ESTABLISHING COMMUNICATION BETWEEN SAID FIXED PORT MEMBER AND SAID SAMPLE; A MOVABLE PORT MEMBER ADJACENT SAID ARCUATE SLOT; A SECOND TUNNEL ESTABLISHING COMMUNICATION BETWEEN SAID MOVABLE PORT MEMBER AND SAID X-RAY DETECTOR; AND A PAIR OF OPPOSITE MOUNTED RIBBON-LIKE SPIRAL NEGATIVE SPRINGS SEALING EXPOSED PORTIONS OF SAID ARCUATE SLOT, THE FREE ENDS OF EACH OF SAID SPRINGS BEING CARRIED BY SAID MOVABLE PORT MEMBER AND THE AXIAL ENDS OF SAID SPRINGS BEING ROTATABLY CARRIED BY SAID CHAMBER.