US3102960A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Photoelectric device for high precision linear measurement
Assignee: Individual
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Filing: 1960-07-18
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Granted: 1963-09-03
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Expires: 1980-07-18
Abstract
No abstract record available.
Inventors
- 👤 Sick Erwin
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 11:51
CPC Classifications
G; G01; G01B; G01B11/00; G01B11/08; B; B21; B21B; B21B38/00; B21B38/10; G01B11/14
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
228 words
A PHOTOELECTRIC DEVICE FOR HIGH PRECISION MEASUREMENT OF AN OBJECT COMPRISING A LIGHT SOURCE, MEANS FOR FOCUSING A MEASUREMENT BEAM OF LIGHT FROM SAID LIGHT SOURCE AT THE SURFACE OF SAID MEASUREMENT OBJECT FOR ATTENUATION OF SAID BEAM, A COMPARISON OBJECT ADJUSTABLY ARRANGED, MEANS FOR PERIODICALLY DIVERTING THE BEAM OF LIGHT FROM SAID LIGHT SOURCE TO FORM A COMPARISON BEAM AND MEANS FOR FOCUSING SAID COMPARISON BEAM AT A SURFACE OF SAID COMPARISON OBJECT FOR ATTENUATION OF SAID BEAM, THE SURFACE OF SAID COMPARISON OBJECT AT THE AREA OF INCIDENCE WITH SAID COMPARISON BEAM BEING OF SUBSTANTIALLY THE SAME SHAPE AND SURFACE CONDITION AS THE SURFACE OF SAID MEASUREMENT OBJECT AT THE AREA OF INCIDENCE WITH SAID MEASUREMENT LIGHT BEAM, A FIRST REFLEXREFLECTING MEANS FOR RETURNING THE ATTENUATED MEASUREMENT BEAM SUBSTANTIALLY ALONG ITS OUTGOING PATH MOUNTED AT THE SIDE OF SAID MEASUREMENT OBJECT OPPOSITE SAID LIGHT SOURCE, A SECOND REFLEX-REFLECTING MEANS FOR RETURNING THE ATTENUATED COMPARISON BEAM SUBSTANTIALLY ALONG ITS OUTGOING PATH MOUNTED AT THE SIDE OF SAID COMPARISON OBJECT OPPOSITE TO THAT OF SAID LIGHT SOURCE, A PHOTOELECTRIC ELEMENT, MEANS FOR DIRECTING BOTH THE RETURNING MEANSUREMENT BEAM AND THE RETURNING COMPARISON BEAM ON SAID PHOTOELECTRIC ELEMENT, AND MEANS FOR MEASURING THE ELECTRICAL OUTPUT OF SAID PHOTOELECTRIC ELEMENT PRODUCED BY EACH ATTENUATED BEAM AS AN INDICATION OF THE RELATIVE DIMENSIONS OF SAID MEASUREMENT OBJECT AND SAID COMPARISON OBJECT.
Claim 2
Dependent Claim
228 words
A PHOTOELECTRIC DEVICE FOR HIGH PRECISION MEASUREMENT OF AN OBJECT COMPRISING A LIGHT SOURCE, MEANS FOR FOCUSING A MEASUREMENT BEAM OF LIGHT FROM SAID LIGHT SOURCE AT THE SURFACE OF SAID MEASUREMENT OBJECT FOR ATTENUATION OF SAID BEAM, A COMPARISON OBJECT ADJUSTABLY ARRANGED, MEANS FOR PERIODICALLY DIVERTING THE BEAM OF LIGHT FROM SAID LIGHT SOURCE TO FORM A COMPARISON BEAM AND MEANS FOR FOCUSING SAID COMPARISON BEAM AT A SURFACE OF SAID COMPARISON OBJECT FOR ATTENUATION OF SAID BEAM, THE SURFACE OF SAID COMPARISON OBJECT AT THE AREA OF INCIDENCE WITH SAID COMPARISON BEAM BEING OF SUBSTANTIALLY THE SAME SHAPE AND SURFACE CONDITION AS THE SURFACE OF SAID MEASUREMENT OBJECT AT THE AREA OF INCIDENCE WITH SAID MEASUREMENT LIGHT BEAM, A FIRST REFLEXREFLECTING MEANS FOR RETURNING THE ATTENUATED MEASUREMENT BEAM SUBSTANTIALLY ALONG ITS OUTGOING PATH MOUNTED AT THE SIDE OF SAID MEASUREMENT OBJECT OPPOSITE SAID LIGHT SOURCE, A SECOND REFLEX-REFLECTING MEANS FOR RETURNING THE ATTENUATED COMPARISON BEAM SUBSTANTIALLY ALONG ITS OUTGOING PATH MOUNTED AT THE SIDE OF SAID COMPARISON OBJECT OPPOSITE TO THAT OF SAID LIGHT SOURCE, A PHOTOELECTRIC ELEMENT, MEANS FOR DIRECTING BOTH THE RETURNING MEANSUREMENT BEAM AND THE RETURNING COMPARISON BEAM ON SAID PHOTOELECTRIC ELEMENT, AND MEANS FOR MEASURING THE ELECTRICAL OUTPUT OF SAID PHOTOELECTRIC ELEMENT PRODUCED BY EACH ATTENUATED BEAM AS AN INDICATION OF THE RELATIVE DIMENSIONS OF SAID MEASUREMENT OBJECT AND SAID COMPARISON OBJECT.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1966-09-02 | 1967-03-04 | 1967-09-03 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1970-09-02 | 1971-03-04 | 1971-09-03 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1974-09-02 | 1975-03-04 | 1975-09-03 | $7700.00 | Window Closed / Lapsed |