US3099743A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Combined electron probe microanalyzer and x-ray diffraction instrument
Assignee: Individual
•
Filing: 1962-07-05
•
Granted: 1963-07-30
•
Expires: 1982-07-05
Abstract
No abstract record available.
Inventors
- 👤 Ichinokawa Takeo
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-28 09:59
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/252; G; G01; G01N; G01N23/00; G01N23/20; G01N23/205
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
115 words
AN ELECTRON PROBE MICROANALYZER AND X-RAY DIFFRACTION INSTRUMENT, COMPRISING: AN ELECTRON SOURCE AND LENS SYSTEM FOR PROJECTING AN ELECTRON BEAM ONTO A SPECIMEN FOR CAUSING THE SPECIMEN TO EMIT X-RAYS; MEANS FOR DETECTING THE EMITTED X-RAYS; A SPECIMEN HOLDER; A TARGET FILM CAPABLE OF EMITING X-RAYS WHEN STRUCK BY AN ELECTRON BEAM; MEANS FOR REMOVABLY POSITIONING SAID TARGET FILM BETWEEN SAID LENS SYSTEM AND SAID SPECIMEN HOLDER WHEREBY SAID SPECIMEN MAY SELECTIVELY BE BOMBARDED BY X-RAYS EMITTED FROM SAID TARGET FILM; AN X-RAY PHOTOGRAPHIC FILM AND MEANS FOR REMOVABLY POSITIONING SAID PHOTOGRAPHIC FILM FOR RECEIVING BACK REFLECTED X-RAYS FROM SAID SPECIMEN WHEREBY A PHOTOGRAPH OF THE X-RAY DIFFRACTION PATTERN OF SAID SPECIMEN MAY BE OBTAINED.
Claim 2
Dependent Claim
115 words
AN ELECTRON PROBE MICROANALYZER AND X-RAY DIFFRACTION INSTRUMENT, COMPRISING: AN ELECTRON SOURCE AND LENS SYSTEM FOR PROJECTING AN ELECTRON BEAM ONTO A SPECIMEN FOR CAUSING THE SPECIMEN TO EMIT X-RAYS; MEANS FOR DETECTING THE EMITTED X-RAYS; A SPECIMEN HOLDER; A TARGET FILM CAPABLE OF EMITING X-RAYS WHEN STRUCK BY AN ELECTRON BEAM; MEANS FOR REMOVABLY POSITIONING SAID TARGET FILM BETWEEN SAID LENS SYSTEM AND SAID SPECIMEN HOLDER WHEREBY SAID SPECIMEN MAY SELECTIVELY BE BOMBARDED BY X-RAYS EMITTED FROM SAID TARGET FILM; AN X-RAY PHOTOGRAPHIC FILM AND MEANS FOR REMOVABLY POSITIONING SAID PHOTOGRAPHIC FILM FOR RECEIVING BACK REFLECTED X-RAYS FROM SAID SPECIMEN WHEREBY A PHOTOGRAPH OF THE X-RAY DIFFRACTION PATTERN OF SAID SPECIMEN MAY BE OBTAINED.
References Cited (Backward Citations)
No citation records indexed.
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1966-07-29 | 1967-01-28 | 1967-07-30 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1970-07-29 | 1971-01-28 | 1971-07-30 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1974-07-29 | 1975-01-28 | 1975-07-30 | $7700.00 | Window Closed / Lapsed |