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US3048779A
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Diode impedance tester
Assignee: AT&T Inc
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Filing: 1959-04-09
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Granted: 1962-08-07
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Expires: 1979-04-09
Abstract
No abstract record available.
Inventors
- 👤 Thomas E Davis
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-25 10:53
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/26; G01R31/2607; G01R31/2632
Claims Analysis
Total Claims: 0
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References Cited (Backward Citations)
US2585353A
Cited
US2743420A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1965-08-06 | 1966-02-05 | 1966-08-07 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1969-08-06 | 1970-02-05 | 1970-08-07 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1973-08-06 | 1974-02-05 | 1974-08-07 | $7700.00 | Window Closed / Lapsed |