US3036895A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Fluid analysis
Assignee: Consolidated Electrodynamics Corp
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Filing: 1959-07-27
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Granted: 1962-05-29
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Expires: 1979-07-27
Abstract
No abstract record available.
Inventors
- 👤 Leland G Cole
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 06:01
CPC Classifications
G; G01; G01N; G01N27/00; G01N27/02; G01N27/04; G01N27/12; Y; Y10; Y10S; Y10S252/00; Y10S252/95; Y10S436/00; Y10S436/905; Y10T; Y10T436/00; Y10T436/20; Y10T436/207497
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
128 words
THE METHOD OF ANALYZING A GAS HAVING AN UNKNOWN CONCENTRATION OF A COMPONENT WHICH ACTS AS A SEMICONDUCTOR IMPURITY, THE METHOD COMPRISING THE STEPS OF EXPOSING A SEMICONDUCTOR MATERIAL WHICH ENTERS INTO A THERMODYNAMICALLY REVERSIBLE CHEMICAL REACTION WITH THE IMPURITY COMPONENT TO VARIOUS KNOWN GASEOUS CONCENTRATIONS OF THE IMPURITY COMPONENT, MAINTAINING THE SEMICONDUCTOR AT A TEMPERATURE TO EFFECT A THERMODYNAMICALLY REVERSIBLE REACTION WITH THE IMPURITY COMPONENT, PASSING ELECTRIC CURRENT THROUGH THE SEMICONDUCTOR, RECORDING THE ELECTRICAL CONDUCTIVITY OF THE SEMICONDUCTOR WHEN EXPOSED TO THE VARIOUS KNOWN CONCENTRATIONS OF THE IMPURITY COMPONENT, EXPOSING THE SEMICONDUCTOR TO THE GAS HAVING AN UNKNOWN CONCENTRATION OF THE COMPONENT, AND RECORDING THE ELECTRICAL CONDUCTIVITY OF THE SEMICONDUCTOR WHEN IN CONTACT WITH THE GAS WHEREBY THE UNKNOWN CONCENTRATION OF THE IMPURITY COMPONENT MAY BE DETERMINED.
Claim 2
Independent Claim
128 words
THE METHOD OF ANALYZING A GAS HAVING AN UNKNOWN CONCENTRATION OF A COMPONENT WHICH ACTS AS A SEMICONDUCTOR IMPURITY, THE METHOD COMPRISING THE STEPS OF EXPOSING A SEMICONDUCTOR MATERIAL WHICH ENTERS INTO A THERMODYNAMICALLY REVERSIBLE CHEMICAL REACTION WITH THE IMPURITY COMPONENT TO VARIOUS KNOWN GASEOUS CONCENTRATIONS OF THE IMPURITY COMPONENT, MAINTAINING THE SEMICONDUCTOR AT A TEMPERATURE TO EFFECT A THERMODYNAMICALLY REVERSIBLE REACTION WITH THE IMPURITY COMPONENT, PASSING ELECTRIC CURRENT THROUGH THE SEMICONDUCTOR, RECORDING THE ELECTRICAL CONDUCTIVITY OF THE SEMICONDUCTOR WHEN EXPOSED TO THE VARIOUS KNOWN CONCENTRATIONS OF THE IMPURITY COMPONENT, EXPOSING THE SEMICONDUCTOR TO THE GAS HAVING AN UNKNOWN CONCENTRATION OF THE COMPONENT, AND RECORDING THE ELECTRICAL CONDUCTIVITY OF THE SEMICONDUCTOR WHEN IN CONTACT WITH THE GAS WHEREBY THE UNKNOWN CONCENTRATION OF THE IMPURITY COMPONENT MAY BE DETERMINED.
References Cited (Backward Citations)
No citation records indexed.
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1965-05-28 | 1965-11-27 | 1966-05-29 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1969-05-28 | 1969-11-27 | 1970-05-29 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1973-05-28 | 1973-11-27 | 1974-05-29 | $7700.00 | Window Closed / Lapsed |