US2706791A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Semi-conductor
Assignee: General Electric Co
•
Filing: 1951-06-18
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Granted: 1955-04-19
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Expires: 1971-06-18
Abstract
No abstract record available.
Inventors
- 👤 John E Jacobs
- 👤 Frerichs Rudolf
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 11:41
CPC Classifications
G; G01; G01T; G01T1/00; G01T1/16; G01T1/26
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
71 words
THE METHOD OF DETECTING CHANGES IN THE INTENSITY LEVEL OF PULSATING X-RAYS WHICH COMPRISES APPLYING SAID PULSATING X-RAYS UPON CADMIUM SULPHIDE AS A SEMI-CONDUCTOR TO THEREBY RAPIDLY CHANGE THE ALTERNATING CURRENT IMPEDANCE OF THE SEMI-CONDUCTOR, AS A PRECISE FUNCTION THE INTENSITY OF IMPINGING X-RAYS, WHILE SIMULTANEOUSLY OF CHANGING THE DIRECT CURRENT RESISTANCE THEREOF AT A RELATIVELY SLOW RATE, AND MEASURING THE ALTERNATING CURRENT IMPEDANCE AS DISTINGUISHED FROM THE DIRECT CURRENT RESISTANCE.
Claim 2
Independent Claim
71 words
THE METHOD OF DETECTING CHANGES IN THE INTENSITY LEVEL OF PULSATING X-RAYS WHICH COMPRISES APPLYING SAID PULSATING X-RAYS UPON CADMIUM SULPHIDE AS A SEMI-CONDUCTOR TO THEREBY RAPIDLY CHANGE THE ALTERNATING CURRENT IMPEDANCE OF THE SEMI-CONDUCTOR, AS A PRECISE FUNCTION THE INTENSITY OF IMPINGING X-RAYS, WHILE SIMULTANEOUSLY OF CHANGING THE DIRECT CURRENT RESISTANCE THEREOF AT A RELATIVELY SLOW RATE, AND MEASURING THE ALTERNATING CURRENT IMPEDANCE AS DISTINGUISHED FROM THE DIRECT CURRENT RESISTANCE.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1958-04-18 | 1958-10-18 | 1959-04-19 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1962-04-18 | 1962-10-18 | 1963-04-19 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1966-04-18 | 1966-10-18 | 1967-04-19 | $7700.00 | Window Closed / Lapsed |