Inspecting method of active matrix panel

Abstract

Abstract PURPOSE:To make it possible to ensure inspection and correction in a short time, by imparting a signal to a picture-element-signal holding capacitor through thin film transistors (TFTs), and obtaining the address of a defective part by using said signal, which is read out through the TFTs. CONSTITUTION:An active matrix board 10 is composed of signal lines X1-X3, scanning lines Y1-Y5, TFTs 1 and 3, a picture element electrode 3 and a picture-element-signal holding capacitor 6. The board 10 and a substrate, on which a counter electrode 5 is provided, are made to face each other. A liquid crystal 4 is sealed between the board and the substrate. Thus an active matrix panel is formed. Since the board 10 has the TFTs 1 and 2 for the electrode 3, the device can be recovered by cutting the defective TFT when one is normal even if the other fails. A signal is imparted to the capacitor 6 through the TFTs 1 and 2. The signal is read out through the TFTs 1 and 2. The address of the defective part is obtained by using the read out signal.

Inventors

• 👤 Yojiro Matsueda

Bibliographic Details